Sfoglia per Autore
An Insight into effects Induced by Heavy-Ion Strikes in SCR ESD Protection Structures
2011 Griffoni, Alessio; S., Thijs; S. H., Chen; Tazzoli, Augusto; M., Cordoni; P., Colombo; Paccagnella, Alessandro; D., Linten; Meneghesso, Gaudenzio; G., Groeseneken
ESD and Ionizing Radiation Effects on Ultrathin Body SOI and Multiple Gate Technologies
2010 Griffoni, Alessio
Angular and Strain Dependence of Heavy-Ions Induced Degradation in SOI FinFETs
2010 Griffoni, Alessio; Gerardin, Simone; Meneghesso, Gaudenzio; Paccagnella, Alessandro; Simoen, E; Claeys, C.
Impact of radiation on the operation and reliability of deep submicron CMOS
2010 C., Claeys; S., Put; Griffoni, Alessio; Cester, Andrea; Gerardin, Simone; Meneghesso, Gaudenzio; Paccagnella, Alessandro; E., Simoen
Electrical-Based ESD Characterization of Ultrathin-Body SOI MOSFETs
2010 Griffoni, Alessio; Thijs, S; Russ, C; Tremouilles, D; Linten, D; Scholz, M; Simoen, E; Claeys, C; Meneghesso, Gaudenzio; Groeseneken, G.
Impact of radiation on the operation and reliability of deep submicron CMOS
2010 C., Claeys; S., Put; Griffoni, Alessio; Cester, Andrea; S., Gerardin; Meneghesso, Gaudenzio; Paccagnella, Alessandro; E., Simoen
Angular and strain dependence of heavy-ions induced degradation in SOI FinFETs2009 European Conference on Radiation and Its Effects on Components and Systems
2009 Griffoni, Alessio; Gerardin, Simone; Meneghesso, Gaudenzio; Paccagnella, Alessandro; Eddy, Simoen; Cor, Claeys
An Insight into the Parasitic Capacitances of SOI and Bulk FinFET Devices
2009 Griffoni, Alessio; S., Thijs; D., Linten; M., Scholz; G., Groeseneken; Meneghesso, Gaudenzio
On-Wafer Human Metal Model Measurements for System-Level ESD Analysis on Component Level
2009 M., Scholz; D., Linten; S., Thijs; Griffoni, Alessio; M., Sawada; T., Nakaei; T., Hasebe; D., Lafonteese; V., Vashchenko; G., Vandersteen; P., Hopper; Meneghesso, Gaudenzio; G., Groeseneken
Next Generation FinFET Devices in Bulk Silicon Technology and Their Benefits for ESD Robustness
2009 Griffoni, Alessio; S., Thijs; C., Russ; D., Tremouilles; D., Linten; M., Scholz; N., Collaert; L., Witters; Meneghesso, Gaudenzio; G., Groeseneken
A Statistical Approach to Microdose Induced Degradation in FinFET Devices
2009 Griffoni, Alessio; Gerardin, Simone; Roussel, Pj; Degraeve, R; Meneghesso, Gaudenzio; Paccagnella, Alessandro; Simoen, E; Claeys, C.
Dose Enhancement Due to Interconnects in Deep-Submicron MOSFETs Exposed to X-Rays
2009 Griffoni, Alessio; Silvestri, Marco; Gerardin, Simone; Meneghesso, Gaudenzio; Paccagnella, Alessandro; Kaczer, B; DE TEN BROECK, Md; Verbeeck, R; Nackaerts, A.
ESD Constraints of Bulk FinFET in Comparison with SOI FinFET Structures
2009 Griffoni, Alessio; S., Thijs; C., Russ; D., Tremouilles; D., Linten; M., Scholz; N., Collaert; L., Witters; Meneghesso, Gaudenzio; G., Groeseneken
Electrostatic Discharge Effects In Fully Depleted SOI MOSFETs with Ultra-Thin Gate Oxide and Different Strain-Inducing Techniques
2008 Griffoni, Alessio; Tazzoli, Augusto; Gerardin, Simone; E., Simoen; C., Claeys; Meneghesso, Gaudenzio
Microdose and Breakdown Effects Induced by Heavy Ions on sub 32-nm Triple-Gate SOI FETs
2008 Griffoni, Alessio; Gerardin, Simone; Meneghesso, Gaudenzio; Paccagnella, Alessandro; E., Simoen; S., Put; C., Claeys
ESD Sensitivity of 65nm Fully Depleted SOI MOSFETs with Different Strain-Inducing Techniques
2008 Griffoni, Alessio; Tazzoli, Augusto; Gerardin, Simone; E., Simoen; C., Claeys; Meneghesso, Gaudenzio
Microdose and Breakdown Effects Induced by Heavy Ions on sub 20-nm Triple-Gate SOI FETs
2008 Griffoni, Alessio; S., Gerardin; Meneghesso, Gaudenzio; Paccagnella, Alessandro; E., Simoen; S., Put; C., Claeys
Dose Enhancement due to Interconnects in Deep-Submicron MOSFETs Exposed to X-Rays
2008 Griffoni, Alessio; Silvestri, Marco; Gerardin, Simone; Meneghesso, Gaudenzio; Paccagnella, Alessandro; B., Kaczer; M., DE POTTER DE TEN BROECK; R., Verbeeck; AND A., Nackaerts
Ionizing Radiation Effects on Advanced CMOS Devices and on ESD Protection Structures for CMOS Technology
2008 Griffoni, Alessio; Meneghesso, Gaudenzio; Paccagnella, Alessandro
Multi-gate devices for the 32-nm node and beyond: advantages and issues
2008 Griffoni, Alessio; E., Simoen; N., Collaert; C., Claeys; Paccagnella, Alessandro; Meneghesso, Gaudenzio
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