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Mostrati risultati da 1 a 20 di 69
Titolo Data di pubblicazione Autore(i) Rivista Serie Titolo libro
CdTe solar cells: Technology, operation and reliability 2021 Barbato M.Bertoncello M.Meneghini M.Trivellin N.Mantoan E.Zanoni E.Meneghesso G. + JOURNAL OF PHYSICS D. APPLIED PHYSICS - -
A new method for CdSexTe1-x band grading for high efficiency thin-absorber CdTe solar cells 2021 Gasparotto A.Barbato M.Meneghini M.Meneghesso G. + SOLAR ENERGY MATERIALS AND SOLAR CELLS - -
Electrical, optical characterization and degradation of Cu(InGa)Se2 devices with fluorine-doped tin oxide back contact 2021 Bertoncello M.Barbato M.Caria A.Buffolo M.De Santi C.Vogrig D.Meneghesso G.Meneghini M. + MICROELECTRONICS RELIABILITY - -
Inactivating SARS-CoV-2 Using 275 nm UV-C LEDs through a Spherical Irradiation Box: Design, Characterization and Validation 2021 Trivellin, NicolaBuffolo, MatteoOnelia, FrancescoPizzolato, AlbertoBarbato, MarcoDel Vecchio, ClaudiaDughiero, FabrizioZanoni, EnricoMeneghesso, GaudenzioCrisanti, AndreaMeneghini, Matteo + MATERIALS - -
Influence of CdTe solar cell properties on stability at high temperatures 2020 Bertoncello M.Barbato M.Trivellin N.Zanoni E.Meneghini M.Meneghesso G. + MICROELECTRONICS RELIABILITY - -
Fast System to measure the dynamic onresistance of on-wafer 600 v normally off GaN HEMTs in hard-switching application conditions 2020 Barbato A.Barbato M.Meneghini M.Spiazzi G.Meneghesso G.Zanoni E. + IET POWER ELECTRONICS - -
Power GaN HEMT degradation: From time-dependent breakdown to hot-electron effects 2019 Meneghini, M.Barbato, A.Borga, M.De Santi, C.Barbato, M.Stoffels, S.Meneghesso, G.Zanoni, E. + - TECHNICAL DIGEST - INTERNATIONAL ELECTRON DEVICES MEETING Technical Digest - International Electron Devices Meeting, IEDM
Analysis of magnesium zinc oxide layers for high efficiency CdTe devices 2019 Barbato, MarcoMeneghini, MatteoMeneghesso, Gaudenzio + THIN SOLID FILMS - -
ESD-failure of E-mode GaN HEMTs: Role of device geometry and charge trapping 2019 Canato E.Meneghini M.Nardo A.Masin F.Barbato A.Barbato M.Zanoni E.Meneghesso G. + MICROELECTRONICS RELIABILITY - -
Degradation of GaN-Based Lateral and Vertical Devices—Challenges and Perspectives 2019 Matteo MeneghiniCarlo De SantiAlessandro BarbatoMatteo BorgaEleonora CanatoFrancesca ChiocchettaElena FabrisZhan GaoFabrizio MasinKalparupa MukherjeeArianna NardoFabiana RampazzoMaria RuzzarinMehdi RzinAlaleh TajalliMarco BarbatoGaudenzio MeneghessoEnrico Zanoni - - Proceedings of the 13th International Conference on Nitride Semiconductors 2019 (ICNS-13)
Difluorochloromethane treated thin CdS buffer layers for improved CdTe solar cells 2019 Barbato, MarcoMeneghini, MatteoMeneghesso, Gaudenzio + THIN SOLID FILMS - -
Degradation physics of GaN-based lateral and vertical devices 2019 Meneghini M.De Santi C.Barbato A.Borga M.Canato E.CHIOCCHETTA, FRANCESCAFabris E.Masin F.Nardo A.Rampazzo F.Ruzzarin M.Tajalli A.Barbato M.Meneghesso G.Zanoni E. - PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING Proceedings of SPIE - The International Society for Optical Engineering
Reliability investigation on CdTe solar cells submitted to short-term thermal stress 2019 Bertoncello M.Barbato M.Meneghini M.Meneghesso G. + MICROELECTRONICS RELIABILITY - -
On Wafer Application Testing for 600 V E-mode GaN HEMTs in Boost Regime 2018 A. BarbatoM. BarbatoM. MeneghiniG. SpiazziG. MeneghessoE. Zanoni + - - Proceedings of the GaN Marathon 2.0
Analysis of the effects of voltage pulses on P3HT:PCBM polymeric solar cells by means of TLP technique 2018 Buonomo, M.Torto, L.Barbato, M.Wrachien, N.Rizzo, A.Cester, A. + MICROELECTRONICS RELIABILITY - -
Reliability Issues in Lateral and Vertical GaN FETs for Power Electronics 2018 G. MeneghessoM. MeneghiniC. De SantiA. BarbatoM. BarbatoM. BorgaE. CanatoE. FabrisF. MasinM. RuzzarinA. TajalliE. Zanoni - - Proceedings of the 2018 International Workshop on Nitride Semiconductors (IWN 2018)
Long-term stresses on linear micromirrors for pico projector application 2017 Silvestrini, M.Barbato, M.Meneghesso, G. + MICROELECTRONICS RELIABILITY - -
Effects of thermal stress on hybrid perovskite solar cells with different encapsulation techniques 2017 RIZZO, ANTONIOTORTO, LORENZOBARBATO, MARCOWRACHIEN, NICOLACESTER, ANDREADI CARLO, ALDO + - - IEEE International Reliability Physics Symposium Proceedings
Evidence of mechanical degradation in microelectromechanical switches subjected to long-Term stresses 2017 BARBATO, MARCOBARBATO, ALESSANDROSilvestrini, MatteoCESTER, ANDREAMENEGHESSO, GAUDENZIO + - - IEEE International Reliability Physics Symposium Proceedings
Field- and current-driven degradation of GaN-based power HEMTs with p-GaN gate: Dependence on Mg-doping level 2017 Rossetto, I.Meneghini, M.Canato, E.Barbato, M.Stoffels, S.Meneghesso, G.Zanoni, E. + MICROELECTRONICS RELIABILITY - -
Mostrati risultati da 1 a 20 di 69
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