DAL LAGO, MATTEO

DAL LAGO, MATTEO  

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Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
"Hot-plugging" of LED modules: Electrical characterization and device degradation 2013 DAL LAGO, MATTEOMENEGHINI, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
Chip and package-related degradation of high power white LEDs 2012 MENEGHINI, MATTEODAL LAGO, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
Degradation Mechanisms of High Power LEDs for Lighting Applications: an overview 2014 MENEGHINI, MATTEODAL LAGO, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS - -
Degradation mechanisms of high-power white LEDs activated by current and temperature 2011 DAL LAGO, MATTEOMENEGHINI, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO MICROELECTRONICS RELIABILITY - -
ESD degradation and robustness of RGB LEDs and modules: An investigation based on combined electrical and optical measurements 2014 MENEGHINI, MATTEOVACCARI, SIMONEDAL LAGO, MATTEOBARBATO, MARCOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
ESD on GaN-based LEDs: An analysis based on dynamic electroluminescence measurements and current waveforms 2014 DAL LAGO, MATTEOMENEGHINI, MATTEODE SANTI, CARLOBARBATO, MARCOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO MICROELECTRONICS RELIABILITY - -
Failure causes and mechanisms of retrofit LED lamps 2015 DE SANTI, CARLODAL LAGO, MATTEOBUFFOLO, MATTEOMONTI, DESIREEMENEGHINI, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO MICROELECTRONICS RELIABILITY - -
Phosphors for LED-based light sources: Thermal properties and reliability issues 2012 DAL LAGO, MATTEOMENEGHINI, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
Reliability issues in GaN-based light-emitting diodes: Effect of dc and PWM stress 2012 MENEGHINI, MATTEODAL LAGO, MATTEOTRIVELLIN, NICOLAZANONI, ENRICOMENEGHESSO, GAUDENZIO + MICROELECTRONICS RELIABILITY - -
Reliability oriented design of LED-based light sources 2013 MENEGHINI, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICODAL LAGO, MATTEOTRIVELLIN, NICOLA LED PROFESSIONAL REVIEW - -
Thermally Activated Degradation of Remote Phosphors for Application in LED Lighting 2013 MENEGHINI, MATTEODAL LAGO, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY - -