VOGRIG, DANIELE

VOGRIG, DANIELE  

Dipartimento di Ingegneria dell'Informazione - DEI  

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Risultati 1 - 11 di 11 (tempo di esecuzione: 0.105 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
A 0.35-mu m CMOS analog turbo decoder for the 40-bit rate 1/3 UMTS channel code 2005 VOGRIG, DANIELEGEROSA, ANDREANEVIANI, ANDREA + IEEE JOURNAL OF SOLID-STATE CIRCUITS - -
A 5 Mb/s UWB-IR Transceiver Front-End for Wireless Sensor Networks in 0.13um CMOS 2011 SOLDA', SILVIACARUSO, MICHELEBEVILACQUA, ANDREAGEROSA, ANDREAVOGRIG, DANIELENEVIANI, ANDREA IEEE JOURNAL OF SOLID-STATE CIRCUITS - -
A symbol-duty-cycled 440-pJ/b impulse radio receiver with 0.57-aJ sensitivity in 130-nm CMOS 2017 VOGRIG, DANIELEBEVILACQUA, ANDREAGEROSA, ANDREANEVIANI, ANDREA IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES - -
An Energy-Detector for Noncoherent Impulse-Radio UWB Receivers 2009 GEROSA, ANDREASOLDA', SILVIABEVILACQUA, ANDREAVOGRIG, DANIELENEVIANI, ANDREA IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS. I, REGULAR PAPERS - -
Analysis and Design of Reactive Passive Mixers for High-Order Modulation IoT Cartesian Transmitters 2023 Tomasin, LorenzoVogrig, DanieleNeviani, AndreaBevilacqua, Andrea IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES - -
Capture and emission time map to investigate the positive VTH shift in p-GaN power HEMTs 2022 Modolo N.Fregolent M.Masin F.Benato A.Bettini A.Buffolo M.De Santi C.Borga M.Vogrig D.Neviani A.Meneghesso G.Zanoni E.Meneghini M. + MICROELECTRONICS RELIABILITY - -
Comparison between Cu(In,Ga)Se2 solar cells with different back contacts submitted to current stress 2022 Caria, ABuffolo, MDe Santi, CTrivellin, NVogrig, DZanoni, EMeneghesso, GMeneghini, M + MICROELECTRONICS RELIABILITY - -
Design, Simulation, and Testing of a CMOS Analog Deocder for the Block Length-40 UMTS Turbo Code 2006 VOGRIG, DANIELENEVIANI, ANDREAGEROSA, ANDREA + IEEE TRANSACTIONS ON COMMUNICATIONS - -
Electrical, optical characterization and degradation of Cu(InGa)Se2 devices with fluorine-doped tin oxide back contact 2021 Bertoncello M.Barbato M.Caria A.Buffolo M.De Santi C.Vogrig D.Meneghesso G.Meneghini M. + MICROELECTRONICS RELIABILITY - -
Recent progress of RD53 Collaboration towards next generation Pixel Read-Out Chip for HL-LHC 2016 BAGATIN, MARTABISELLO, DARIOMATTIAZZO, SERENADING, LILIGERARDIN, SIMONEGIUBILATO, PIERONEVIANI, ANDREAPACCAGNELLA, ALESSANDROVOGRIG, DANIELEWYSS, JEFFERY + JOURNAL OF INSTRUMENTATION - -
Test results and prospects for RD53A, a large scale 65 nm CMOS chip for pixel readout at the HL-LHC 2019 M. BagatinD. BiselloS. GerardinS. MattiazzoA. PaccagnellaD. VogrigS. Bonaldo + NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT - -