ZANONI, ENRICO

ZANONI, ENRICO  

Dipartimento di Ingegneria dell'Informazione - DEI  

Mostra records
Risultati 1 - 20 di 520 (tempo di esecuzione: 0.027 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
"Hot-plugging" of LED modules: Electrical characterization and device degradation 2013 DAL LAGO, MATTEOMENEGHINI, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
'Hole Redistribution' Model Explaining the Thermally Activated RONStress/Recovery Transients in Carbon-Doped AlGaN/GaN Power MIS-HEMTs 2021 Meneghini M.Meneghesso G.Zanoni E. + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
2.1 A/mm current density AlGaN/GaN HEMT 2003 CHINI, ALESSANDROMENEGHESSO, GAUDENZIOZANONI, ENRICOBUTTARI, DARIO + ELECTRONICS LETTERS - -
2DEG Retraction and Potential Distribution of GaN-on-Si HEMTs Investigated Through a Floating Gate Terminal 2018 Rossetto, I.Meneghini, M.De Santi, C.PANDEY, SUDIPMeneghesso, G.Zanoni, E. + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
A combined electro-optical method for the determination of the recombination parameters in InGaN-based light-emitting diodes 2009 MENEGHINI, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + JOURNAL OF APPLIED PHYSICS - -
A combined Monte Carlo and experimental analysis of light emission phenomena in AlGaAs/GaAs HBTs 1998 NEVIANI, ANDREAZANONI, ENRICO + SEMICONDUCTOR SCIENCE AND TECHNOLOGY - -
A fully electronic sensor for the measurement of cDNA hybridization kinetics 2007 CAGNIN, STEFANOZANONI, ENRICOLANFRANCHI, GEROLAMO + BIOSENSORS & BIOELECTRONICS - -
A model for the thermal degradation of metal/(p-GaN) interface in GaN-based light emitting diodes 2008 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOMENEGHESSO, GAUDENZIOZANONI, ENRICO + JOURNAL OF APPLIED PHYSICS - -
A new approach to correlate transport processes and optical efficiency in GaN-based LEDs 2009 MENEGHINI, MATTEOZANONI, ENRICO + JOURNAL OF PHYSICS D. APPLIED PHYSICS - -
A novel fast and versatile temperature measurement system for LDMOS transistors 2005 TAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIOZANONI, ENRICO MICROELECTRONICS RELIABILITY - -
A novel in-situ approach to monitor the variations in the on-resistance of power transistors during switching operation 2023 Cavaliere, A.De Santi, C.Meneghesso, G.Zanoni, E.Meneghini, M. MICROELECTRONICS RELIABILITY - -
A novel on-wafer approach to test the stability of GaN-based devices in hard switching conditions: Study of hot-electron effects 2020 Modolo N.Meneghini M.Barbato A.Nardo A.De Santi C.Meneghesso G.Zanoni E. + MICROELECTRONICS RELIABILITY - -
A physical model for the reverse leakage current in (In,Ga)N/GaN light-emitting diodes based on nanowires 2016 DE SANTI, CARLOMENEGHINI, MATTEOZANONI, ENRICO + JOURNAL OF APPLIED PHYSICS - -
A Physics-Based Approach to Model Hot-Electron Trapping Kinetics in p-GaN HEMTs 2021 Modolo N.De Santi C.Meneghesso G.Zanoni E.Meneghini M. + IEEE ELECTRON DEVICE LETTERS - -
A review of the reliability of integrated ir laser diodes for silicon photonics 2021 Buffolo M.De Santi C.Meneghesso G.Zanoni E.Meneghini M. + ELECTRONICS - -
A Review on the Physical Mechanisms That Limit the Reliability of GaN-Based LEDs 2010 MENEGHINI, MATTEOTAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIOZANONI, ENRICO + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
A review on the reliability of GaN-based LEDs 2008 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOMENEGHESSO, GAUDENZIOZANONI, ENRICO IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY - -
A short-term high-current-density reliability investigation of AlGaAs/GaAs heterojunction bipolar transistors 1998 ZANONI, ENRICO + IEEE ELECTRON DEVICE LETTERS - -
A simple method for the thermal resistance measurement of AlGaAs/GaAs heterojunction bipolar transistors 1998 ZANONI, ENRICO + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
A study of ESD- induced defects in high-voltage nMOS and pMOS transistors 1992 ZANONI, ENRICO + MICROELECTRONICS JOURNAL - -