WRACHIEN, NICOLA

WRACHIEN, NICOLA  

Dipartimento di Ingegneria dell'Informazione - DEI  

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Risultati 1 - 20 di 35 (tempo di esecuzione: 0.043 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
A General Equivalent Circuit Model for a Metal/Organic/Liquid/Metal System 2018 Lago, NicoloBuonomo, MarcoWrachien, NicolaCester, Andrea + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
A physical-based equivalent circuit model for an organic/electrolyte interface 2016 LAGO, NICOLO'CESTER, ANDREAWRACHIEN, NICOLABARBATO, MARCORIZZO, ANTONIOMENEGHESSO, GAUDENZIO + ORGANIC ELECTRONICS - -
Analysis of the effects of voltage pulses on P3HT:PCBM polymeric solar cells by means of TLP technique 2018 Buonomo, M.Torto, L.Barbato, M.Wrachien, N.Rizzo, A.Cester, A. + MICROELECTRONICS RELIABILITY - -
Application of an Open-Circuit Voltage Decay Model to Compare the Performances of Donor Polymers in Bulk Heterojunction Solar Cells 2018 TORTO, LORENZOCester, AndreaWrachien, NicolaRizzo, Antonio + IEEE JOURNAL OF PHOTOVOLTAICS - -
Application of Photocurrent Model on Polymer Solar Cells Under Forward Bias Stress 2016 RIZZO, ANTONIOTORTO, LORENZOWRACHIEN, NICOLACESTER, ANDREA + IEEE JOURNAL OF PHOTOVOLTAICS - -
Characterization and modeling of organic (P3HT:PCBM) solar cells as a function of bias and illumination 2016 RIZZO, ANTONIOCESTER, ANDREAWRACHIEN, NICOLALAGO, NICOLO'BARBATO, MARCO + SOLAR ENERGY MATERIALS AND SOLAR CELLS - -
Comparison between positive and negative constant current stress on dye-sensitized solar cells 2013 BARI, DANIELEWRACHIEN, NICOLAMENEGHESSO, GAUDENZIOCESTER, ANDREA + MICROELECTRONICS RELIABILITY - -
Drift-diffusion and analytical modeling of the recombination mechanisms in organic solar cells: Effect of the nonconstant charge distribution inside the active layer 2018 Torto, LorenzoCester, AndreaWrachien, Nicola + IEEE JOURNAL OF PHOTOVOLTAICS - -
Effects of constant voltage and constant current stress in PCBM: P3HT solar cells 2015 CESTER, ANDREARIZZO, ANTONIOLAGO, NICOLO'BARBATO, MARCOWRACHIEN, NICOLA + MICROELECTRONICS RELIABILITY - -
Effects of constant voltage stress on p- and n-type organic thin film transistors with poly(methyl methacrylate) gate dielectric 2013 WRACHIEN, NICOLACESTER, ANDREABARI, DANIELEMENEGHESSO, GAUDENZIO + MICROELECTRONICS RELIABILITY - -
Effects of Positive and Negative Stresses on III-V MOSFETs With Al(2)O(3) Gate Dielectric 2011 WRACHIEN, NICOLACESTER, ANDREAZANONI, ENRICOMENEGHESSO, GAUDENZIO + IEEE ELECTRON DEVICE LETTERS - -
Effects of stair case gate bias stress in IGZO/Al2O3 flexible TFTs 2018 Buonomo, M.Wrachien, N.Lago, N.Cester, A. + MICROELECTRONICS RELIABILITY - -
Effects of thermal and electrical stress on DH4T-based organic thin-film-transistors with PMMA gate dielectrics 2015 WRACHIEN, NICOLALAGO, NICOLO'RIZZO, ANTONIOMENEGHESSO, GAUDENZIOCESTER, ANDREA + MICROELECTRONICS RELIABILITY - -
Enhanced permanent degradation of organic TFT under electrical stress and visible light exposure 2012 WRACHIEN, NICOLABARI, DANIELEMENEGHESSO, GAUDENZIOCESTER, ANDREA + MICROELECTRONICS RELIABILITY - -
Impact of Trapped Charge and Interface Defects on the Degradation of the Optical and Electrical Characteristics in NPD/Alq3 OLEDs 2010 PINATO, ALESSANDROCESTER, ANDREAMENEGHINI, MATTEOWRACHIEN, NICOLATAZZOLI, AUGUSTOZANONI, ENRICOMENEGHESSO, GAUDENZIO + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Improved Tolerance Against UV and Alpha Irradiation of Encapsulated Organic TFTs 2012 WRACHIEN, NICOLACESTER, ANDREABARI, DANIELEMENEGHESSO, GAUDENZIO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Investigation of Mobility Transient on Organic Transistor by Means of DLTS Technique 2016 LAGO, NICOLO'CESTER, ANDREAWRACHIEN, NICOLAMENEGHESSO, GAUDENZIO + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Investigation of Proton and X-Ray Irradiation Effects on Nanocrystal and Floating Gate Memory Cell Arrays 2008 WRACHIEN, NICOLACESTER, ANDREA + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Ionising radiation and electrical stress on nanocrystal memory cell array 2007 CESTER, ANDREAGASPERIN, ALBERTOWRACHIEN, NICOLAPACCAGNELLA, ALESSANDRO + MICROELECTRONICS RELIABILITY - -
Ionizing Radiation Effects on Ferroelectric Non Volatile Memories and its Dependence on the Irradiation Temperature 2008 WRACHIEN, NICOLACESTER, ANDREA + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -