BUFFOLO, MATTEO

BUFFOLO, MATTEO  

Dipartimento di Ingegneria dell'Informazione - DEI  

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Risultati 1 - 20 di 76 (tempo di esecuzione: 0.039 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
A review of the reliability of integrated ir laser diodes for silicon photonics 2021 Buffolo M.De Santi C.Meneghesso G.Zanoni E.Meneghini M. + ELECTRONICS - -
Addressing the Optical Degradation of 1.3 μm Quantum Dot Lasers through Subthreshold Characterization 2023 Zenari, MicheleBuffolo, MatteoDe Santi, CarloMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + ACS PHOTONICS - -
Analysis of Current Transport Layer Localized Resistivity Increase After High Stress on InGaN LEDs 2023 Trivellin, NicolaBuffolo, MatteoDe Santi, CarloZanoni, EnricoMeneghesso, GaudenzioMeneghini, Matteo IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN INDUSTRIAL ELECTRONICS - -
Bias-dependent degradation of single quantum well on InGaN-based light emitting diode 2023 Casu, C.Buffolo, M.Caria, A.Piva, F.De Santi, C.Meneghesso, G.Zanoni, E.Meneghini, M. MICROELECTRONICS RELIABILITY - -
Capture and emission time map to investigate the positive VTH shift in p-GaN power HEMTs 2022 Modolo N.Fregolent M.Masin F.Benato A.Bettini A.Buffolo M.De Santi C.Borga M.Vogrig D.Neviani A.Meneghesso G.Zanoni E.Meneghini M. + MICROELECTRONICS RELIABILITY - -
Carrier capture kinetics, deep levels, and isolation properties of β -Ga2O3Schottky-barrier diodes damaged by nitrogen implantation 2020 De Santi C.Fregolent M.Buffolo M.Meneghesso G.Zanoni E.Meneghini M. + APPLIED PHYSICS LETTERS - -
Challenges and Perspectives for Vertical GaN-on-Si Trench MOS Reliability: From Leakage Current Analysis to Gate Stack Optimization 2021 De Santi, CarloBuffolo, MatteoMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + MATERIALS - -
Challenges and perspectives for vertical gan-on-si trench mos reliability: From leakage current analysis to gate stack optimization 2021 Mukherjee K.De Santi C.Buffolo M.Meneghesso G.Zanoni E.Meneghini M. + MATERIALS - -
Comparison between Cu(In,Ga)Se2 solar cells with different back contacts submitted to current stress 2022 Caria, ABuffolo, MDe Santi, CTrivellin, NVogrig, DZanoni, EMeneghesso, GMeneghini, M + MICROELECTRONICS RELIABILITY - -
Current induced degradation study on state of the art DUV LEDs 2018 Trivellin, N.Monti, D.De Santi, C.Buffolo, M.Meneghesso, G.Zanoni, E.Meneghini, M. MICROELECTRONICS RELIABILITY - -
Deep levels and carrier capture kinetics in n-GaAsBi alloys investigated by deep level transient spectroscopy 2021 Fregolent M.Buffolo M.De Santi C.Meneghesso G.Zanoni E.Meneghini M. + JOURNAL OF PHYSICS D. APPLIED PHYSICS - -
Defects and Reliability of GaN-Based LEDs: Review and Perspectives 2022 Buffolo M.Caria A.Piva F.Roccato N.Casu C.De Santi C.Trivellin N.Meneghesso G.Zanoni E.Meneghini M. PHYSICA STATUS SOLIDI. A, APPLICATIONS AND MATERIALS SCIENCE - -
Degradation mechanisms in high power InGaN semiconductor lasers investigated by electrical, optical, spectral and C-DLTS measurements 2020 Piva F.De Santi C.Buffolo M.Meneghesso G.Zanoni E.Meneghini M. + MICROELECTRONICS RELIABILITY - -
Degradation mechanisms of 1.3 μm C-doped quantum dot lasers grown on native substrate 2021 Zenari M.Buffolo M.De Santi C.Meneghesso G.Zanoni E.Meneghini M. + MICROELECTRONICS RELIABILITY - -
Degradation Mechanisms of Heterogeneous III-V/Silicon 1.55- μm DBR Laser Diodes 2017 Buffolo, MatteoMeneghini, MatteoDe Santi, CarloMeneghesso, GaudenzioZanoni, Enrico + IEEE JOURNAL OF QUANTUM ELECTRONICS - -
Degradation mechanisms of heterogeneous III-V/Silicon loop-mirror laser diodes for photonic integrated circuits 2018 Buffolo, M.PIETROBON, MARIKADe Santi, C.SAMPARISI, FABIOMeneghesso, G.Zanoni, E.Meneghini, M. + MICROELECTRONICS RELIABILITY - -
Degradation of 1.3 μm InAs Quantum-Dot Laser Diodes: Impact of Dislocation Density and Number of Quantum Dot Layers 2020 Buffolo M.De Santi C.Meneghesso G.Zanoni E.Meneghini M. + IEEE JOURNAL OF QUANTUM ELECTRONICS - -
Degradation of AlGaN-based UV-C SQW LEDs analyzed by means of capacitance deep-level transient spectroscopy and numerical simulations 2023 Piva F.Pilati M.Buffolo M.Roccato N.De Santi C.Meneghesso G.Zanoni E.Meneghini M. + APPLIED PHYSICS LETTERS - -
Degradation of GaN-Based Multiple Quantum Wells Solar Cells Under Forward Bias: Investigation Based on Optical Measurements and Steady-State Photocapacitance 2023 Caria, ADe Santi, CBuffolo, MNicoletto, MMeneghesso, GZanoni, EMeneghini, M + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Degradation processes of 280 nm high power DUV LEDs: Impact on parasitic luminescence 2019 Trivellin N.Monti D.Piva F.Buffolo M.De Santi C.Zanoni E.Meneghesso G.Meneghini M. JAPANESE JOURNAL OF APPLIED PHYSICS - -