TREVISANELLO, LORENZO ROBERTO
 Distribuzione geografica
Continente #
NA - Nord America 2242
EU - Europa 158
AS - Asia 128
SA - Sud America 1
Totale 2529
Nazione #
US - Stati Uniti d'America 2242
CN - Cina 83
FI - Finlandia 44
DE - Germania 43
VN - Vietnam 39
UA - Ucraina 29
SE - Svezia 14
GB - Regno Unito 11
IT - Italia 9
AT - Austria 4
IN - India 4
IE - Irlanda 3
BR - Brasile 1
EE - Estonia 1
HK - Hong Kong 1
TR - Turchia 1
Totale 2529
Città #
Fairfield 399
Woodbridge 287
Ann Arbor 209
Houston 197
Wilmington 154
Chandler 151
Seattle 150
Ashburn 146
Jacksonville 145
Cambridge 143
Princeton 42
Dong Ket 39
Des Moines 31
San Diego 29
Beijing 25
Nanjing 21
Medford 20
Boardman 19
Helsinki 14
Hebei 7
Nanchang 7
Jiaxing 6
Shenyang 5
Southend 5
Changsha 4
Jinan 4
Norwalk 4
Dublin 3
Nürnberg 3
Redwood City 3
Frankfurt am Main 2
Herzogenaurach 2
Indiana 2
New York 2
Bengaluru 1
Berlin 1
Buffalo 1
Central District 1
Guangzhou 1
Haikou 1
Jõgeva 1
London 1
Mountain View 1
New Kensington 1
Padova 1
Rome 1
San Francisco 1
Simi Valley 1
Stra 1
Tianjin 1
Venice 1
Vienna 1
Villorba 1
Walnut 1
Yenibosna 1
Zhengzhou 1
Totale 2302
Nome #
Analysis of the role of current in the degradation of InGaN-based laser diodes 147
Accelerated life test of high brightness light emitting diodes 147
A model for the thermal degradation of metal/(p-GaN) interface in GaN-based light emitting diodes 132
Failure mechanisms of gallium nitride LEDs related with passivation 123
Analysis of the Diffusion Involved in the Degradation of InGaN-Based Laser Diodes 121
Extensive analysis of the degradation of phosphor-converted LEDs 112
High-temperature degradation of GaN LEDs related to passivation 111
High temperature electro-optical degradation of InGaN/GaN HBLEDs 109
High-temperature failure of GaN LEDs related with passivation 108
High temperature instabilities of ohmic contacts on p-GaN 101
Thermal stability analysis of High Brightness LED during high temperature and electrical aging 98
A review on the reliability of GaN-based LEDs 98
Thermal degradation of InGaN/GaN LEDs ohmic contacts 95
High brightness GaN LEDs degradation during dc and pulsed stress 94
Analysis of the role of current in the degradation of InGaN-based laser diodes 93
Reversible degradation of GaN LEDs related to passivation 90
Thermally activated degradation and package instabilities of low power PC-LEDs 86
High temperature instabilities of ohmic contacts on p-GaN 82
Reversible degradation of ohmic contacts on p-GaN for application in high-brightness LEDs 81
Thermal degradation of InGaN/GaN LEDs ohmic contacts 80
Combined Optical And Electrical Analysis of AlGaN-Based Deep-UV LEDs Reliability 79
Electro-thermally Activated Degradation of Blu-Ray GaN-based Laser Diodes 62
High temperature instabilities of GaN LEDs related to passivation 55
Thermal-activated degradation mechanism on Phosphor-Converted Light Emitting Diode 35
Study of the factors that limit the reliability of GaN-based LEDs at high temperature levels 34
High temperature instabilities of GaN LEDs related to passivation 34
Study of the reliability and degradation mechanisms of GaN LEDs 32
Analysis of the Temperature impact on Reliability of GaN-based Light Emitting Diodes 29
High temperature degradation of ohmic contacts on p-GaN 25
High temperature instabilities of ohmic contacts on Mg-doped gallium nitride 20
Analysis of the Degradation of Blu-Ray Laser Diodes 20
Totale 2533
Categoria #
all - tutte 4568
article - articoli 1883
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 6451


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2017/201821 0000 00 00 20190
2018/2019261 00312 02 017 3468872
2019/2020834 77137243 8265 5583 87455819
2020/2021359 3025729 2931 1230 50313946
2021/2022346 8506228 1013 2034 1765147
2022/2023331 5234238 6064 326 52000
Totale 2533