TREVISANELLO, LORENZO ROBERTO

TREVISANELLO, LORENZO ROBERTO  

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Risultati 1 - 20 di 31 (tempo di esecuzione: 0.023 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
A model for the thermal degradation of metal/(p-GaN) interface in GaN-based light emitting diodes 2008 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOMENEGHESSO, GAUDENZIOZANONI, ENRICO + JOURNAL OF APPLIED PHYSICS - -
A review on the reliability of GaN-based LEDs 2008 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOMENEGHESSO, GAUDENZIOZANONI, ENRICO IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY - -
Accelerated life test of high brightness light emitting diodes 2008 TREVISANELLO, LORENZO ROBERTOMENEGHINI, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO + IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY - -
Analysis of the Degradation of Blu-Ray Laser Diodes 2008 TRIVELLIN, NICOLAMENEGHINI, MATTEOMENEGHESSO, GAUDENZIOTREVISANELLO, LORENZO ROBERTOZANONI, ENRICO + - - -
Analysis of the Diffusion Involved in the Degradation of InGaN-Based Laser Diodes 2009 MENEGHINI, MATTEOTRIVELLIN, NICOLATREVISANELLO, LORENZO ROBERTOZANONI, ENRICOMENEGHESSO, GAUDENZIO + - - -
Analysis of the role of current in the degradation of InGaN-based laser diodes 2009 MENEGHINI, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOTREVISANELLO, LORENZO ROBERTOZANONI, ENRICO + PHYSICA STATUS SOLIDI. C, CURRENT TOPICS IN SOLID STATE PHYSICS - -
Analysis of the role of current in the degradation of InGaN-based laser diodes 2008 MENEGHINI, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOTREVISANELLO, LORENZO ROBERTOZANONI, ENRICO + - - -
Analysis of the Temperature impact on Reliability of GaN-based Light Emitting Diodes 2008 Trevisanello, Lorenzo Roberto - - -
Combined Optical And Electrical Analysis of AlGaN-Based Deep-UV LEDs Reliability 2008 MENEGHINI, MATTEOTRIVELLIN, NICOLATREVISANELLO, LORENZO ROBERTOZANONI, ENRICOMENEGHESSO, GAUDENZIO + - - -
Electro-thermally Activated Degradation of Blu-Ray GaN-based Laser Diodes 2008 MENEGHINI, MATTEOMENEGHESSO, GAUDENZIOTRIVELLIN, NICOLATREVISANELLO, LORENZO ROBERTOZANONI, ENRICO + - - -
Extensive analysis of the degradation of phosphor-converted LEDs 2009 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - Proc. SPIE 7422, 74220H, 2009, Ninth International Conference on Solid State Lighting
Failure mechanisms of gallium nitride LEDs related with passivation 2005 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOLEVADA, SIMONEMENEGHESSO, GAUDENZIOTAMIAZZO, GIANLUCAZANONI, ENRICO + - - -
High brightness GaN LEDs degradation during dc and pulsed stress 2006 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
High temperature degradation of ohmic contacts on p-GaN 2007 TRIVELLIN, NICOLAMENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - -
High temperature electro-optical degradation of InGaN/GaN HBLEDs 2007 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
High temperature instabilities of GaN LEDs related to passivation 2007 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOMENEGHESSO, GAUDENZIOZANONI, ENRICO - - -
High temperature instabilities of GaN LEDs related to passivation 2006 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - -
High temperature instabilities of ohmic contacts on Mg-doped gallium nitride 2007 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - -
High temperature instabilities of ohmic contacts on p-GaN 2008 TREVISANELLO, LORENZO ROBERTOMENEGHINI, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO + PHYSICA STATUS SOLIDI. C, CURRENT TOPICS IN SOLID STATE PHYSICS - -
High temperature instabilities of ohmic contacts on p-GaN 2007 TREVISANELLO, LORENZO ROBERTOMENEGHINI, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - -