BAGATIN, MARTA
BAGATIN, MARTA
Dipartimento di Ingegneria dell'Informazione - DEI
A Heavy-Ion Beam Monitor Based on 3-D NAND Flash Memories
2021 Gerardin, S.; Bagatin, M.; Paccagnella, A.; Beltrami, S.; Costantino, A.; Santin, G.; Pesce, A.; Ferlet-Cavrois, V.; Voss, K.
A Heavy-Ion Detector Based on 3-D NAND Flash Memories
2020 Bagatin, M.; Frost, C.; Gerardin, S.; Paccagnella, A.; Beltrami, S.; Costantino, A.; Poivey, C.; Santin, G.; Ferlet-Cavrois, V.; Cazzaniga, C.
A new hardware/software platform and a new 1/E neutron source for soft error studies: Testing FPGAs at the ISIS facility
2007 Violante, M; Sterpone, L.; Manuzzato, Andrea; Gerardin, Simone; Rech, Paolo; Bagatin, Marta; Paccagnella, Alessandro; Andreani, C.; Gorini, G.; Pietropaolo, A.; Cardarilli, G.; Pontarelli, S.; Frost, C.
Analysis of TID Failure Modes in SRAM-Based FPGA Under Gamma-Ray and Focused Synchrotron X-Ray Irradiation
2014 Lili, Ding; Hongxia, Guo; Wei, Chen; Zhibin, Yao; Yihua, Yan; Dongliang, Chen; Paccagnella, Alessandro; Gerardin, Simone; Bagatin, Marta; Lei, Chen; Huabo, Sun; Ruyu, Fan
Angular Dependence of Heavy-Ion Induced Errors in Floating Gate Memories
2011 Gerardin, Simone; Bagatin, Marta; Paccagnella, Alessandro; A., Visconti; M., Bonanomi; S., Beltrami
Annealing of Heavy-Ion Induced Floating Gate Errors: LET and Feature Size Dependence
2010 Bagatin, Marta; Gerardin, Simone; Cellere, Giorgio; Paccagnella, Alessandro; Visconti, A; Beltrami, S; Bonanomi, M; HARBOE SORENSEN, R.
Atmospheric Neutron Soft Errors in 3D NAND Flash Memories
2019 Bagatin, M.; Gerardin, S.; Paccagnella, A.; Beltrami, S.; Cazzaniga, C.; Frost, C. D.
Atmospheric-like neutron attenuation during accelerated neutron testing with multiple printed circuit boards
2018 Cazzaniga, Carlo; Bhuva, Bharat; Bagatin, Marta; Gerardin, Simone; Marchese, Nicolo; Frost, Christopher D.
Can Atmospheric Neutrons Induce Soft Errors in NAND Floating Gate Memories?
2009 Cellere, Giorgio; Gerardin, Simone; Bagatin, Marta; Paccagnella, Alessandro; Visconti, A; Bonanomi, M; Beltrami, S; HARBOE SORENSEN, R; Virtanen, A; Roche, P.
Catastrophic Failure in Highly Scaled Commercial NAND Flash Memories
2010 Irom, F; Nguyen, Dn; Bagatin, Marta; Cellere, Giorgio; Gerardin, Simone; Paccagnella, Alessandro
Characterizing High-Energy Ion Beams with PIPS Detectors
2020 Bagatin, M.; Ferlet-Cavrois, V.; Gerardin, S.; Muschitiello, M.; Paccagnella, A.; Costantino, A.; Santin, G.; Boatella Polo, C.; Alia, R. G.; Fernandez Martinez, P.; Kastriotou, M.
Comparison of radiation degradation induced by x-ray and 3-MeV protons in 65-nm CMOS transistors
2016 Ding, Lili; Gerardin, Simone; Bagatin, Marta; Bisello, Dario; Mattiazzo, Serena; Paccagnella, Alessandro
Degradation of Sub 40-nm NAND Flash Memories Under Total Dose Irradiation
2012 Gerardin, Simone; Bagatin, Marta; Paccagnella, Alessandro; Véronique Ferlet, Cavrois
Depth Dependence of Neutron-induced Errors in 3D NAND Floating Gate Cells
2023 Gerardin, S.; Bagatin, M.; Paccagnella, A.; Beltrami, S.; Benvenuti, A.; Cazzaniga, C.
Depth Dependence of Threshold Voltage Shift in 3-D Flash Memories Exposed to X-Rays
2021 Bagatin, M.; Gerardin, S.; Paccagnella, A.; Beltrami, S.
Destructive events in NAND Flash memories irradiated with heavy ions
2010 Bagatin, Marta; Gerardin, Simone; Paccagnella, Alessandro; Cellere, Giorgio; Irom, F; Nguyen, Dn
Drain Current Collapse in 65 nm pMOS Transistors After Exposure to Grad Dose
2015 Ding, Lili; Gerardin, Simone; Bagatin, Marta; Mattiazzo, Serena; Bisello, Dario; Paccagnella, Alessandro
Effects of Heavy-Ion Irradiation on Vertical 3-D NAND Flash Memories
2018 Bagatin, M.; Gerardin, S.; Paccagnella, A.; Beltrami, S.; Camerlenghi, Ettore; Bertuccio, M.; Costantino, Alessandro; Zadeh, A.; Ferlet-Cavrois, V.; Santin, G.; Daly, E.
Effects of high energy x ray and proton irradiation on lead zirconate titanate thin films' dielectric and piezoelectric response
2013 Y., Bastani; A. Y., Cortés Peña; A. D., Wilson; Gerardin, Simone; Bagatin, Marta; Paccagnella, Alessandro; N., Bassiri Gharb
Effects of Total Ionizing Dose on the Retention of 41-nm NAND Flash Cells
2011 Bagatin, Marta; Gerardin, Simone; Paccagnella, Alessandro; Angelo, Visconti; Silvia, Beltrami; Massimo, Bertuccio; Laura T., Czeppel