BAGATIN, MARTA
BAGATIN, MARTA
Dipartimento di Ingegneria dell'Informazione - DEI
65 nm technology for HEP: Status and perspective
2014 Valerio, Pierpaolo; Barbero, M. B.; Fougeron, D.; Gensolen, F.; Godiot, S.; Menouni, M.; Pangaud, P.; Rozanov, A.; Wang, A.; Bomben, M.; Calderini, G.; Crescioli, F.; Genat, J. F.; Le Dortz, O.; Marchiori, G.; Dzahini, D.; Rarbi, F. E.; Gaglione, R.; Gonella, L.; Hemperek, T.; Huegging, F.; Karagounis, M.; Kishishita, T.; Krueger, H.; Rymaszewski, P.; Wermes, N.; Ciciriello, F.; Corsi, F.; Licciulli, F.; Marzocca, C.; De Robertis, G.; Loddo, F.; Tamma, C.; Andreazza, A.; Liberali, V.; Shojaii, S.; Stabile, A.; Bagatin, Marta; Bisello, Dario; Mattiazzo, Serena; Ding, Lili; Gerardin, Simone; Giubilato, Piero; Neviani, Andrea; Paccagnella, Alessandro; Vogrig, Daniele; Wyss, J.; Bacchetta, N.; De Canio, F.; Gaioni, L.; Nodari, B.; Manghisoni, M.; Re, V.; Traversi, G.; Comotti, D.; Ratti, L.; Vacchi, C.; Beccherle, R.; Bellazzini, R.; Magazzu, G.; Minuti, M.; Morsani, F.; Palla, F.; Fanucci, L.; Rizzi, A.; Saponara, S.; Androsov, K.; Bilei, G. M.; Menichelli, M.; Conti, E.; Marconi, S.; Passeri, D.; Placidi, P.; Della Casa, G.; Demaria, N.; Mazza, G.; Rivetti, A.; Da Rocha Rolo, M. D.; Monteil, E.; Pacher, L.; Gajanana, D.; Gromov, V.; Hessey, N.; Kluit, R.; Zivkovic, V.; Havranek, M.; Janoska, Z.; Marcisovsky, M.; Neue, G.; Tomasek, L.; Kafka, V.; Sicho, P.; Vrba, V.; Vila, I.; Aguirre, M. A.; Muã±oz, F.; Palomo, F. R.; Abbaneo, D.; Christiansen, J.; Dannheim, D.; Dobos, D.; Linssen, L.; Pernegger, H.; Alipour Tehrani, N.; Bell, S.; Prydderch, M. L.; Thomas, S.; Christian, D. C.; Deptuch, G.; Fahim, F.; Hoff, J.; Lipton, R.; Liu, T.; Zimmerman, T.; Garcia Sciveres, M.; Gnani, D.; Mekkaoui, A.; Gorelov, I.; Hoeferkamp, M.; Seidel, S.; Toms, K.; De Witt, J. N.; Grillo, A.
A Heavy-Ion Beam Monitor Based on 3-D NAND Flash Memories
2021 Gerardin, S.; Bagatin, M.; Paccagnella, A.; Beltrami, S.; Costantino, A.; Santin, G.; Pesce, A.; Ferlet-Cavrois, V.; Voss, K.
A Heavy-Ion Detector Based on 3-D NAND Flash Memories
2020 Bagatin, M.; Frost, C.; Gerardin, S.; Paccagnella, A.; Beltrami, S.; Costantino, A.; Poivey, C.; Santin, G.; Ferlet-Cavrois, V.; Cazzaniga, C.
A low cost robust radiation hardened flip-flop circuit
2017 Jain, A.; Gupta, A.; Garg, S.; Veggetti, A.; Castelnovo, A.; Crippa, D.; Gerardin, S.; Bagatin, M.; Cazzaniga, C.
A Multi-Megarad, Radiation Hardened by Design 512 kbit SRAM in CMOS Technology
2010 Calligaro, C; Liberali, V; Stabile, A; Bagatin, Marta; Gerardin, Simone; Paccagnella, Alessandro
A new hardware/software platform and a new 1/E neutron source for soft error studies: Testing FPGAs at the ISIS facility
2007 Violante, M; Sterpone, L.; Manuzzato, Andrea; Gerardin, Simone; Rech, Paolo; Bagatin, Marta; Paccagnella, Alessandro; Andreani, C.; Gorini, G.; Pietropaolo, A.; Cardarilli, G.; Pontarelli, S.; Frost, C.
A Study on the Short- and Long-Term Effects of X-Ray Exposure on NAND Flash Memories
2011 Gerardin, Simone; Bagatin, Marta; Paccagnella, Alessandro; Visconti, A; Beltrami, S; Bertuccio, M; Czeppel, Lt
Alpha, Heavy Ion and Neutron Test Results On 90nm ST BCD-CMOS technology
2020 Jain, Abhishek; Veggetti, Andrea; Crippa, D.; Benfante, A.; Gerardin, S.; Bagatin, M.; Cazzaniga, C.
Alpha-induced soft errors in Floating Gate flash memories
2012 Bagatin, Marta; Gerardin, Simone; Paccagnella, Alessandro; Ferlet Cavrois, V.
Analysis of TID failure modes in SRAM-based FPGA based on gamma-ray and synchrotron X-ray irradiation
2013 Ding, Li Li; Guo, Hong Xia; Chen, Wei; Yao, Zhi Bin; Yan, Yi Hua; Chen, Dong Liang; Paccagnella, Alessandro; Gerardin, Simone; Bagatin, Marta; Chen, Lei; Sun, Hua Bo; Fan, Ru Yu
Analysis of TID Failure Modes in SRAM-Based FPGA Under Gamma-Ray and Focused Synchrotron X-Ray Irradiation
2014 Lili, Ding; Hongxia, Guo; Wei, Chen; Zhibin, Yao; Yihua, Yan; Dongliang, Chen; Paccagnella, Alessandro; Gerardin, Simone; Bagatin, Marta; Lei, Chen; Huabo, Sun; Ruyu, Fan
Angular Dependence of Heavy-Ion Induced Errors in Floating Gate Memories
2011 Gerardin, Simone; Bagatin, Marta; Paccagnella, Alessandro; A., Visconti; M., Bonanomi; S., Beltrami
Annealing of Heavy-Ion Induced Floating Gate Errors: LET and Feature Size Dependence
2010 Bagatin, Marta; Gerardin, Simone; Cellere, Giorgio; Paccagnella, Alessandro; Visconti, A; Beltrami, S; Bonanomi, M; HARBOE SORENSEN, R.
Annealing of heavy-ion induced floating gate errors: LET and feature size dependence
2009 Bagatin, Marta; Gerardin, Simone; Giorgio, Cellere; Paccagnella, Alessandro; Angelo, Visconti; Silvia, Beltrami; Mauro, Bonanomi; Reno Harboe, Sorensen
Assessing SRAM sensitivity to ionizing radiation through a low-energy accelerator
2006 Bagatin, M.; Gerardin, S.; Rech, P.; Cester, Andrea; Paccagnella, A.
Atmospheric Neutron Soft Errors in 3D NAND Flash Memories
2019 Bagatin, M.; Gerardin, S.; Paccagnella, A.; Beltrami, S.; Cazzaniga, C.; Frost, C. D.
Atmospheric-like neutron attenuation during accelerated neutron testing with multiple printed circuit boards
2018 Cazzaniga, Carlo; Bhuva, Bharat; Bagatin, Marta; Gerardin, Simone; Marchese, Nicolo; Frost, Christopher D.
Can Atmospheric Neutrons Induce Soft Errors in NAND Floating Gate Memories?
2009 Cellere, Giorgio; Gerardin, Simone; Bagatin, Marta; Paccagnella, Alessandro; Visconti, A; Bonanomi, M; Beltrami, S; HARBOE SORENSEN, R; Virtanen, A; Roche, P.
Catastrophic Failure in Highly Scaled Commercial NAND Flash Memories
2010 Irom, F; Nguyen, Dn; Bagatin, Marta; Cellere, Giorgio; Gerardin, Simone; Paccagnella, Alessandro
Characterizing High-Energy Ion Beams with PIPS Detectors
2020 Bagatin, M.; Ferlet-Cavrois, V.; Gerardin, S.; Muschitiello, M.; Paccagnella, A.; Costantino, A.; Santin, G.; Boatella Polo, C.; Alia, R. G.; Fernandez Martinez, P.; Kastriotou, M.