GERARDIN, SIMONE
GERARDIN, SIMONE
Dipartimento di Ingegneria dell'Informazione - DEI
1GigaRad TID impact on 28 nm HEP analog circuits
2018 Resta, F.; Gerardin, S.; Mattiazzo, S.; Paccagnella, A.; De Matteis, M.; Enz, C.; Baschirotto, A.
A Heavy-Ion Beam Monitor Based on 3-D NAND Flash Memories
2021 Gerardin, S.; Bagatin, M.; Paccagnella, A.; Beltrami, S.; Costantino, A.; Santin, G.; Pesce, A.; Ferlet-Cavrois, V.; Voss, K.
A Heavy-Ion Detector Based on 3-D NAND Flash Memories
2020 Bagatin, M.; Frost, C.; Gerardin, S.; Paccagnella, A.; Beltrami, S.; Costantino, A.; Poivey, C.; Santin, G.; Ferlet-Cavrois, V.; Cazzaniga, C.
A new hardware/software platform and a new 1/E neutron source for soft error studies: Testing FPGAs at the ISIS facility
2007 Violante, M; Sterpone, L.; Manuzzato, Andrea; Gerardin, Simone; Rech, Paolo; Bagatin, Marta; Paccagnella, Alessandro; Andreani, C.; Gorini, G.; Pietropaolo, A.; Cardarilli, G.; Pontarelli, S.; Frost, C.
A Statistical Approach to Microdose Induced Degradation in FinFET Devices
2009 Griffoni, Alessio; Gerardin, Simone; Roussel, Pj; Degraeve, R; Meneghesso, Gaudenzio; Paccagnella, Alessandro; Simoen, E; Claeys, C.
Analysis of TID Failure Modes in SRAM-Based FPGA Under Gamma-Ray and Focused Synchrotron X-Ray Irradiation
2014 Lili, Ding; Hongxia, Guo; Wei, Chen; Zhibin, Yao; Yihua, Yan; Dongliang, Chen; Paccagnella, Alessandro; Gerardin, Simone; Bagatin, Marta; Lei, Chen; Huabo, Sun; Ruyu, Fan
Angular and Strain Dependence of Heavy-Ions Induced Degradation in SOI FinFETs
2010 Griffoni, Alessio; Gerardin, Simone; Meneghesso, Gaudenzio; Paccagnella, Alessandro; Simoen, E; Claeys, C.
Angular Dependence of Heavy-Ion Induced Errors in Floating Gate Memories
2011 Gerardin, Simone; Bagatin, Marta; Paccagnella, Alessandro; A., Visconti; M., Bonanomi; S., Beltrami
Annealing of Heavy-Ion Induced Floating Gate Errors: LET and Feature Size Dependence
2010 Bagatin, Marta; Gerardin, Simone; Cellere, Giorgio; Paccagnella, Alessandro; Visconti, A; Beltrami, S; Bonanomi, M; HARBOE SORENSEN, R.
Atmospheric Neutron Soft Errors in 3D NAND Flash Memories
2019 Bagatin, M.; Gerardin, S.; Paccagnella, A.; Beltrami, S.; Cazzaniga, C.; Frost, C. D.
Atmospheric-like neutron attenuation during accelerated neutron testing with multiple printed circuit boards
2018 Cazzaniga, Carlo; Bhuva, Bharat; Bagatin, Marta; Gerardin, Simone; Marchese, Nicolo; Frost, Christopher D.
Can Atmospheric Neutrons Induce Soft Errors in NAND Floating Gate Memories?
2009 Cellere, Giorgio; Gerardin, Simone; Bagatin, Marta; Paccagnella, Alessandro; Visconti, A; Bonanomi, M; Beltrami, S; HARBOE SORENSEN, R; Virtanen, A; Roche, P.
Catastrophic Failure in Highly Scaled Commercial NAND Flash Memories
2010 Irom, F; Nguyen, Dn; Bagatin, Marta; Cellere, Giorgio; Gerardin, Simone; Paccagnella, Alessandro
Channel Hot Carrier Stress on Irradiated 130-nm NMOSFETs
2008 Silvestri, Marco; Gerardin, Simone; Paccagnella, Alessandro; Faccio, F; Gonella, L.
Channel-Hot-Carrier Degradation and Bias Temperature Instabilities in CMOS Inverters
2009 MARTIN MARTINEZ, J; Gerardin, Simone; Amat, E; Rodriguez, R; Nafria, M; Aymerich, X; Paccagnella, Alessandro; Ghidini, G.
Characterizing High-Energy Ion Beams with PIPS Detectors
2020 Bagatin, M.; Ferlet-Cavrois, V.; Gerardin, S.; Muschitiello, M.; Paccagnella, A.; Costantino, A.; Santin, G.; Boatella Polo, C.; Alia, R. G.; Fernandez Martinez, P.; Kastriotou, M.
Charge buildup and spatial distribution of interface traps in 65-nm pMOSFETs irradiated to ultrahigh doses
2019 Bonaldo, S.; Gerardin, S.; Jin, X.; Paccagnella, A.; Faccio, F.; Borghello, G.; Fleetwood, D. M.
Comparison of radiation degradation induced by x-ray and 3-MeV protons in 65-nm CMOS transistors
2016 Ding, Lili; Gerardin, Simone; Bagatin, Marta; Bisello, Dario; Mattiazzo, Serena; Paccagnella, Alessandro
DC response, low-frequency noise, and TID-induced mechanisms in 16-nm FinFETs for high-energy physics experiments
2022 Bonaldo, S.; Ma, T.; Mattiazzo, S.; Baschirotto, A.; Enz, C.; Fleetwood, D. M.; Paccagnella, A.; Gerardin, S.
Degradation induced by 2-MeV alpha particles on AlGaN/GaN High Electron Mobility Transistors
2006 Danesin, Francesca; Zanon, Franco; Gerardin, Simone; Rampazzo, Fabiana; Meneghesso, Gaudenzio; Zanoni, Enrico; Paccagnella, Alessandro