TAZZOLI, AUGUSTO
TAZZOLI, AUGUSTO
K-band capacitive MEMS switches on GaAs substrate: Design, fabrication, and reliability
2012 A., Persano; Tazzoli, Augusto; P., Farinelli; Meneghesso, Gaudenzio; P., Siciliano; F., Quaranta
A comprehensive study of MEMS behavior under EOS/ESD events: Breakdown characterization, dielectric charging, and realistic cures
2011 Tazzoli, Augusto; Barbato, Marco; Ritrovato, V; Meneghesso, Gaudenzio
Acceleration of Microwelding on Ohmic RF-MEMS Switches
2011 Tazzoli, Augusto; Meneghesso, Gaudenzio
An active heat-based restoring mechanism for improving the reliability of RF-MEMS switches
2011 Iannacci, J; Faes, A; Repchankova, A; Tazzoli, Augusto; Meneghesso, Gaudenzio
Design and Characterization of an Active Recovering Mechanism for High Performance RF MEMS Redundancy Switches
2011 F., Solazzi; Tazzoli, Augusto; P., Farinelli; A., Faes; V., Mulloni; B., Margesin; Meneghesso, Gaudenzio
ESD sensitivity of a GaAs MMIC microwave power amplifier
2011 Tazzoli, Augusto; Rossetto, Isabella; Zanoni, Enrico; Dai, Yf; Tomasi, T; Meneghesso, Gaudenzio
A Review on the Physical Mechanisms That Limit the Reliability of GaN-Based LEDs
2010 Meneghini, Matteo; Tazzoli, Augusto; Mura, G; Meneghesso, Gaudenzio; Zanoni, Enrico
Enhancement of RF-MEMS switch reliability through an active anti-stiction heat-based mechanism
2010 Iannacci, J; Repchankova, A; Faes, A; Tazzoli, Augusto; Meneghesso, Gaudenzio; DALLA BETTA, Gf
Experimental Investigation on the Exploitation of an Active Mechanism to Restore the Operability of Malfunctioning RF-MEMS Switches
2010 J., Iannacci; A., Repchankova; A., Faes; Tazzoli, Augusto; Meneghesso, Gaudenzio; M., Niessner
Impact of Trapped Charge and Interface Defects on the Degradation of the Optical and Electrical Characteristics in NPD/Alq3 OLEDs
2010 Pinato, Alessandro; Cester, Andrea; Meneghini, Matteo; Wrachien, Nicola; Tazzoli, Augusto; S., Xia; V., Adamovich; M. S., Weaver; J. J., Brown; Zanoni, Enrico; Meneghesso, Gaudenzio
Reliability issues of Gallium Nitride High Electron Mobility Transistors
2010 Meneghesso, Gaudenzio; Meneghini, Matteo; Tazzoli, Augusto; Ronchi, Nicolo'; Stocco, Antonio; A., Chini; Zanoni, Enrico
Soft and Hard Failures of InGaN-Based LEDs Submitted to Electrostatic Discharge Testing
2010 Meneghini, Matteo; Tazzoli, Augusto; Butendeich, R; Hahn, B; Meneghesso, Gaudenzio; Zanoni, Enrico
Study of the actuation speed, bounces occurrences, and contact reliability of ohmic RF-MEMS switches
2010 Tazzoli, Augusto; Barbato, Marco; Mattiuzzo, F; Ritrovato, V; Meneghesso, Gaudenzio
Time-To-Latch-Up investigation of SCR devices as ESD protection structures on 65 nm technology platform
2010 Tazzoli, Augusto; Cordoni, M; Colombo, P; Bergonzoni, C; Meneghesso, Gaudenzio
Breakdown characterization of gate oxides in 35 and 70 angstrom BCD8 smart power technology
2009 Tazzoli, Augusto; Cerati, L; Andreini, A; Meneghesso, Gaudenzio
Reliability analysis of AlGaN/GaN HEMT on SopSiC composite substrate under long-term DC-life test
2009 Ronchi, Nicolo'; Zanon, Franco; Stocco, Antonio; Tazzoli, Augusto; Zanoni, Enrico; Meneghesso, Gaudenzio
Electrical characterization and reliability study of HEMTs on composite substrates under high electric fields
2008 Tazzoli, Augusto; Meneghesso, Gaudenzio; Zanon, Franco; Danesin, Francesca; Zanoni, Enrico; Bove, P; Langer, R; Thorpe, J.
Reliability of GaN high-electron-mobility transistors: State of the art and perspectives
2008 Meneghesso, Gaudenzio; Verzellesi, G; Danesin, Francesca; Rampazzo, Fabiana; Zanon, Franco; Tazzoli, Augusto; Meneghini, Matteo; Zanoni, Enrico
Thermal storage effects on AlGaN/GaN HEMT
2008 Danesin, Francesca; Tazzoli, Augusto; Zanon, Franco; Meneghesso, Gaudenzio; Zanoni, Enrico; Cetronio, A; Lanzied, C; Lavanga, S; Peroni, M; Romanini, P.
Electrostatic Discharge and Cycling effects on Ohmic and capacitive RF-MEMS Switches
2007 Tazzoli, Augusto; Peretti, Vanni; Meneghesso, Gaudenzio