TAZZOLI, AUGUSTO

TAZZOLI, AUGUSTO  

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Risultati 1 - 20 di 24 (tempo di esecuzione: 0.039 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
A comprehensive study of MEMS behavior under EOS/ESD events: Breakdown characterization, dielectric charging, and realistic cures 2011 TAZZOLI, AUGUSTOBARBATO, MARCOMENEGHESSO, GAUDENZIO + JOURNAL OF ELECTROSTATICS - -
A novel fast and versatile temperature measurement system for LDMOS transistors 2005 TAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIOZANONI, ENRICO MICROELECTRONICS RELIABILITY - -
A Review on the Physical Mechanisms That Limit the Reliability of GaN-Based LEDs 2010 MENEGHINI, MATTEOTAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIOZANONI, ENRICO + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Acceleration of Microwelding on Ohmic RF-MEMS Switches 2011 TAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIO JOURNAL OF MICROELECTROMECHANICAL SYSTEMS - -
An active heat-based restoring mechanism for improving the reliability of RF-MEMS switches 2011 TAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIO + MICROELECTRONICS RELIABILITY - -
Breakdown characterization of gate oxides in 35 and 70 angstrom BCD8 smart power technology 2009 TAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIO + MICROELECTRONICS RELIABILITY - -
Design and Characterization of an Active Recovering Mechanism for High Performance RF MEMS Redundancy Switches 2011 TAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIO + INTERNATIONAL JOURNAL OF MICROWAVE AND WIRELESS TECHNOLOGIES - -
Electrical characterization and reliability study of HEMTs on composite substrates under high electric fields 2008 TAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIOZANON, FRANCODANESIN, FRANCESCAZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
Electrostatic Discharge and Cycling effects on Ohmic and capacitive RF-MEMS Switches 2007 TAZZOLI, AUGUSTOPERETTI, VANNIMENEGHESSO, GAUDENZIO IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY - -
Electrostatic Discharge Effects in Irradiated Fully Depleted SOI MOSFETs with Ultra-Thin Gate Oxide 2007 GERARDIN, SIMONEGRIFFONI, ALESSIOTAZZOLI, AUGUSTOCESTER, ANDREAMENEGHESSO, GAUDENZIOPACCAGNELLA, ALESSANDRO IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Electrostatic discharge effects in ultrathin gate oxide MOSFETs 2006 CESTER, ANDREAGERARDIN, SIMONETAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIO IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY - -
Enhancement of RF-MEMS switch reliability through an active anti-stiction heat-based mechanism 2010 TAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIO + MICROELECTRONICS RELIABILITY - -
ESD sensitivity of a GaAs MMIC microwave power amplifier 2011 TAZZOLI, AUGUSTOROSSETTO, ISABELLAZANONI, ENRICOMENEGHESSO, GAUDENZIO + MICROELECTRONICS RELIABILITY - -
Experimental Investigation on the Exploitation of an Active Mechanism to Restore the Operability of Malfunctioning RF-MEMS Switches 2010 TAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIO + PROCEDIA ENGINEERING - -
Holding voltage investigation of advanced SCR-based protection structures for CMOS technology 2007 TAZZOLI, AUGUSTOMARINO, FABIO ALESSIOZANONI, ENRICOMENEGHESSO, GAUDENZIO + MICROELECTRONICS RELIABILITY - -
Impact of Trapped Charge and Interface Defects on the Degradation of the Optical and Electrical Characteristics in NPD/Alq3 OLEDs 2010 PINATO, ALESSANDROCESTER, ANDREAMENEGHINI, MATTEOWRACHIEN, NICOLATAZZOLI, AUGUSTOZANONI, ENRICOMENEGHESSO, GAUDENZIO + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
K-band capacitive MEMS switches on GaAs substrate: Design, fabrication, and reliability 2012 TAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIO + MICROELECTRONICS RELIABILITY - -
Reliability analysis of AlGaN/GaN HEMT on SopSiC composite substrate under long-term DC-life test 2009 RONCHI, NICOLO'ZANON, FRANCOSTOCCO, ANTONIOTAZZOLI, AUGUSTOZANONI, ENRICOMENEGHESSO, GAUDENZIO MICROELECTRONICS RELIABILITY - -
Reliability issues of Gallium Nitride High Electron Mobility Transistors 2010 MENEGHESSO, GAUDENZIOMENEGHINI, MATTEOTAZZOLI, AUGUSTORONCHI, NICOLO'STOCCO, ANTONIOZANONI, ENRICO + INTERNATIONAL JOURNAL OF MICROWAVE AND WIRELESS TECHNOLOGIES - -
Reliability of GaN high-electron-mobility transistors: State of the art and perspectives 2008 MENEGHESSO, GAUDENZIODANESIN, FRANCESCARAMPAZZO, FABIANAZANON, FRANCOTAZZOLI, AUGUSTOMENEGHINI, MATTEOZANONI, ENRICO + IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY - -