RZIN, MEHDI

RZIN, MEHDI  

Dipartimento di Ingegneria dell'Informazione - DEI  

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Risultati 1 - 8 di 8 (tempo di esecuzione: 0.008 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
On-wafer RF stress and trapping kinetics of Fe-doped AlGaN/GaN HEMTs 2018 RZIN, MEHDIChini, A.De Santi, C.Meneghini, M.Meneghesso, G.Zanoni, E. + MICROELECTRONICS RELIABILITY - -
24 Hours Stress Test and Failure Analysis of 0.25 μm AlGaN/GaN HEMTs 2018 M. RzinF. RampazzoM. MeneghiniG. MeneghessoE. Zanoni + - - Proceedings of the 9th Wide Bandgap Semiconductor and Components workshop
Reliability comparison of AlGaN/GaN HEMTs with different carbon doping concentration 2019 Gao Z.Meneghini M.Rampazzo F.Rzin M.De Santi C.Meneghesso G.Zanoni E. MICROELECTRONICS RELIABILITY - -
Investigation into trapping modes and threshold instabilities of state-of-art commercial GaN HEMTs 2019 Mukherjee K.De Santi C.Rzin M.Gao Z.Meneghesso G.Meneghini M.Zanoni E. MICROELECTRONICS RELIABILITY - -
Degradation of GaN-Based Lateral and Vertical Devices—Challenges and Perspectives 2019 Matteo MeneghiniCarlo De SantiAlessandro BarbatoMatteo BorgaEleonora CanatoFrancesca ChiocchettaElena FabrisZhan GaoFabrizio MasinKalparupa MukherjeeArianna NardoFabiana RampazzoMaria RuzzarinMehdi RzinAlaleh TajalliMarco BarbatoGaudenzio MeneghessoEnrico Zanoni - - Proceedings of the 13th International Conference on Nitride Semiconductors 2019 (ICNS-13)
Reliability and Dynamic Performance of Gallium Nitride-based Devices for Power Applications 2019 C. De SantiM. MeneghiniA. BarbatoM. BorgaE. CanatoF. ChiocchettaE. FabrisZ. GaoF. MasinK. MukherjeeA. NardoM. RuzzarinM. RzinA. TajalliG. MeneghessoE. Zanoni - - Proceedings of MATERIALS RESEARCH MEETING 2019 (MRM2019)
Linearity and robustness evaluation of 150-nm AlN/GaN HEMTs 2019 Rzin M.Meneghini M.Rampazzo F.De Santi C.Medjdoub F.Meneghesso G.Zanoni E. + MICROELECTRONICS RELIABILITY - -
On-Wafer Fast Evaluation of Failure Mechanism of 0.25-μm AlGaN/GaN HEMTs: Evidence of Sidewall Indiffusion 2020 Rzin M.Meneghini M.Rampazzo F.Meneghesso G.Zanoni E. + IEEE TRANSACTIONS ON ELECTRON DEVICES - -