FABRIS, ELENA
FABRIS, ELENA
Università di Padova
Breakdown Walkout in Polarization-Doped Vertical GaN Diodes
2019 Fabris, E.; Meneghesso, G.; Zanoni, E.; Meneghini, M.; De Santi, C.; Caria, A.; Nomoto, K.; Hu, Z.; Li, W.; Gao, X.; Jena, D.; Xing, H. G.
Degradation Mechanisms of GaN-Based Vertical Devices: A Review
2020 Meneghini, M.; Fabris, E.; Ruzzarin, M.; De Santi, C.; Nomoto, K.; Hu, Z.; Li, W.; Gao, X.; Jena, D.; Xing, H. G.; Sun, M.; Palacios, T.; Meneghesso, G.; Zanoni, E.
Degradation of GaN-on-GaN vertical diodes submitted to high current stress
2018 Fabris, E.; Meneghini, M.; De Santi, C.; Hu, Z.; Li, W.; Nomoto, K.; Gao, X.; Jena, D.; Xing, H. G.; Meneghesso, G.; Zanoni, E.
GaN Vertical p-i-n Diodes in Avalanche Regime: Time-Dependent Behavior and Degradation
2020 De Santi, C.; Fabris, E.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Hot-Electron Trapping and Hole-Induced Detrapping in GaN-Based GITs and HD-GITs
2019 Fabris, Elena; Meneghini, Matteo; De Santi, Carlo; Borga, Matteo; Kinoshita, Yusuke; Tanaka, Kenichiro; Ishida, Hidetoshi; Ueda, Tetsuzo; Meneghesso, Gaudenzio; Zanoni, Enrico
Impact of Residual Carbon on Avalanche Voltage and Stability of Polarization-Induced Vertical GaN p-n Junction
2020 Fabris, Elena; De Santi, Carlo; Caria, Alessandro; Mukherjee, Kalparupa; Nomoto, Kazuki; Hu, Zongyang; Li, Wenshen; Gao, Xiang; Marchand, Hugues; Jena, Debdeep; Xing, Huili Grace; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo
Trapping and Detrapping Mechanisms in β-GaO Vertical FinFETs Investigated by Electro-Optical Measurements
2020 Fabris, E.; De Santi, C.; Caria, A.; Li, W.; Nomoto, K.; Hu, Z.; Jena, D.; Xing, H. G.; Meneghesso, G.; Zanoni, E.; Meneghini, M.