Commercial-Off-The-Shelf SRAM-based FPGA devices are becoming of interests for applications where high dependability and low cost are mandatory constraints. This paper proposes a new method for assessing the effects of SEUs in the device configuration memory. The method combines radiation testing for technology characterization and simulation-based fault injection for SEU propagation. Experimental results we gathered with the purpose of modeling the effects of SEUs in the FPGA configuration memory are reported and commented.

Analyzing SEU Effects in SRAM-based FPGAs

PACCAGNELLA, ALESSANDRO;
2003

Abstract

Commercial-Off-The-Shelf SRAM-based FPGA devices are becoming of interests for applications where high dependability and low cost are mandatory constraints. This paper proposes a new method for assessing the effects of SEUs in the device configuration memory. The method combines radiation testing for technology characterization and simulation-based fault injection for SEU propagation. Experimental results we gathered with the purpose of modeling the effects of SEUs in the FPGA configuration memory are reported and commented.
2003
9TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM, PROCEEDINGS
0-7695-1968-7
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11577/1360005
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