Progress in lithography and nanofabrication [E. Di Fabrizio , Nature (London) 401, 895 (1999)] has made it possible to apply differential interference contrast (DIC) in x-ray microscopy using an original x-ray doublet lens based on two specially developed zone plates. Switching from bright-field imaging (absorption contrast) to x-ray DIC, we observe, similar to visible-light microscopy, a dramatic increase in image contrast for weak absorbing samples. We anticipate that this technique will have a significant impact on x-ray imaging and may play a role comparable to DIC imaging in visible-light microscopy. (C) 2001 American Institute of Physics.

Differential interference contrast X-ray microscopy with submicron resolution

ROMANATO, FILIPPO;
2001

Abstract

Progress in lithography and nanofabrication [E. Di Fabrizio , Nature (London) 401, 895 (1999)] has made it possible to apply differential interference contrast (DIC) in x-ray microscopy using an original x-ray doublet lens based on two specially developed zone plates. Switching from bright-field imaging (absorption contrast) to x-ray DIC, we observe, similar to visible-light microscopy, a dramatic increase in image contrast for weak absorbing samples. We anticipate that this technique will have a significant impact on x-ray imaging and may play a role comparable to DIC imaging in visible-light microscopy. (C) 2001 American Institute of Physics.
2001
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11577/153963
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