In this work we investigate the impact of MOSFET degradation on the operation of real circuits through SPICE simulation. We show that by changing a few parameters in a LEVEL 3 model it is possible to reasonably account for the degradation in the characteristics of a single device following electrical stress. We then validate this approach on a simple circuit, a current mirror, and finally analyze the degradation of a more complex one, a voltage controlled oscillator.
Modeling MOSFET and circuit degradation through SPICE
CESTER, ANDREA;GERARDIN, SIMONE;PACCAGNELLA, ALESSANDRO;
2005
Abstract
In this work we investigate the impact of MOSFET degradation on the operation of real circuits through SPICE simulation. We show that by changing a few parameters in a LEVEL 3 model it is possible to reasonably account for the degradation in the characteristics of a single device following electrical stress. We then validate this approach on a simple circuit, a current mirror, and finally analyze the degradation of a more complex one, a voltage controlled oscillator.File in questo prodotto:
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