The characterization of a linear system from input/output measurements is addressed. The use of wideband test waveforms and of a fast time-domain constrained-least-squares algorithm is described. The accuracy of the method is analyzed, and possible applications are outlined.
A time-domain method for the accurate characterization of linear systems
NARDUZZI, CLAUDIO;OFFELLI, CARLO
1990
Abstract
The characterization of a linear system from input/output measurements is addressed. The use of wideband test waveforms and of a fast time-domain constrained-least-squares algorithm is described. The accuracy of the method is analyzed, and possible applications are outlined.File in questo prodotto:
Non ci sono file associati a questo prodotto.
Pubblicazioni consigliate
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
