Optimized sinewave test of waveform digitizers by a DFT approach

The paper presents a particularly simple and effective DFT-based approach for digitizing waveform recorder testing. Its implementation is straightforward and signal processing requirements are confined to the calculation of the DFT, which can be carried out by a readily implemented fast Fourier transform algorithm. Adjustments to the test generator can be determined to ensure that tests are carried out under optimal conditions, providing accurate and reliable estimates of digitizer performance parameters.