This paper reviews failure modes and mechanisms of GaAs MESFETs and low-noise HEMTs, with particular emphasis on degradation mechanisms of Schottky gate and ohmic metallizations
Failure mechanisms of GaAs MESFETs and low-noise HEMTs
ZANONI, ENRICO
1990
Abstract
This paper reviews failure modes and mechanisms of GaAs MESFETs and low-noise HEMTs, with particular emphasis on degradation mechanisms of Schottky gate and ohmic metallizationsFile in questo prodotto:
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