Key ideas on computed tomography measurement corrections applied to a conventional CT machine

This paper focuses on some of the issues that should be taken into account to use a conventional (i.e. non metrological) micro CT machine in manufacturing metrology applications, paying special attention to two of the most important factors affecting measurement accuracy: threshold determination and scale factor. The paper presents a detailed explanation of the correction methods applied at University of Zaragoza for the measurement of two calibrated items used in the first international comparison of CT systems (CT Audit). Finally, the results of the measurements and the main conclusions of the work are shown.