This work deals with a practical approach for determining the metrological structure resolution in X-ray Computed Tomography (CT) for dimensional measurements in manufacturing. Advantages over other applicable approaches are discussed. The experimental results obtained from the implementation of the method using a micro-CT system are compared with the geometrical unsharpness of CT reconstructions.
Practical method for determining the metrological structure resolution of dimensional CT
CARMIGNATO, SIMONE;BALCON, MANUEL;PARISATTO, MATTEO
2013
Abstract
This work deals with a practical approach for determining the metrological structure resolution in X-ray Computed Tomography (CT) for dimensional measurements in manufacturing. Advantages over other applicable approaches are discussed. The experimental results obtained from the implementation of the method using a micro-CT system are compared with the geometrical unsharpness of CT reconstructions.File in questo prodotto:
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