We subjected all-organic complementary inverters to constant voltage stress. We found a 20% maximum variation of DC inverter parameters after a 104-s stress. The largest degradation was in the delay times, which increase up to a factor 7. This is due to the threshold voltage variation in pTFTs and the mobility reduction in nTFTs.

Effects of constant voltage stress on organic complementary logic inverters

WRACHIEN, NICOLA;CESTER, ANDREA;LAGO, NICOLO';MENEGHESSO, GAUDENZIO;
2014

Abstract

We subjected all-organic complementary inverters to constant voltage stress. We found a 20% maximum variation of DC inverter parameters after a 104-s stress. The largest degradation was in the delay times, which increase up to a factor 7. This is due to the threshold voltage variation in pTFTs and the mobility reduction in nTFTs.
2014
proc. of 44th European Solid State Device Research Conference (ESSDERC)
9781479943784
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11577/3100108
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