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Prodotto trovati:
TitoloData di pubblicazioneAutoriRivistaSerieTitolo libro
1Real-Time High Accuracy Measurement of Multifrequency Waveforms1987NARDUZZI, CLAUDIO  ; OFFELLI, CARLO  The Changing Face of I&M Technologies - Proceedings IEEE Instrumentation/Measurement Technology Conference 1987
2An auto-routing multi-server architecture for high-education training on instrumentation and measurement1999BERTOCCO, MATTEO  ; IMTC/99. Proceedings of the 16th IEEE Instrumentation and Measurement Technology Conference (Cat. No.99CH36309)
3Platform independent architecture for distributed measurement systems2000BERTOCCO, MATTEO  ; Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference [Cat. No. 00CH37066]
4Performance of stochastic quantizers employing non-linear processing1995NARDUZZI, CLAUDIO  ; PETRI, DARIO  Integrating Intelligent Instrumentation and Control - Proceedings of 1995 IEEE Instrumentation and Measurement Technology Conference - IMTC '95
5Statistical analysis of high-resolution estimation methods1994BERTOCCO, MATTEO  ; IEEE Intern. Workshop an advanced mathem. methods in electrical and electronic meas. Proceedings
6Statistical analysis of frequency-domain estimation methods for multiple tone signal parameters1994BERTOCCO, MATTEO  ; IEEE Intern. Workshop an advanced mathem. methods in electrical and electronic meas Proceedings
7Comparative analysis of synchronization strategies in sensor network with misbehaving clocks2012CARLI, RUGGERO  ; GIORGI, GIADA  ; NARDUZZI, CLAUDIO  2012 IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2012) Proceedings
8Accuracy performances of ADC parameter estimators1997BERTOCCO, MATTEO  ; NARDUZZI, CLAUDIO  ; PETRI, DARIO  IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings
9A/D converter performance analysis by a frequency domain approach1992BENETAZZO, LUIGINO  ; NARDUZZI, CLAUDIO  ; OFFELLI, CARLO  ; PETRI, DARIO  Conference Record IEEE Instrumentation and Measurement Technology Conference
10Optimized sinewave test of waveform digitizers by a DFT approach1996BERTOCCO, MATTEO  ; NARDUZZI, CLAUDIO  ; PETRI, DARIO  Quality Measurement: The Indispensable Bridge between Theory and Reality (No Measurements? No Science! Joint Conference - 1996: IEEE Instrumentation and Measurement Technology Conference and IMEKO Technical Committee 7. Conference Proceedings

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