Topography characterization of additively manufactured surfaces using CT

X‐ray computed tomography (CT) is increasingly used for evaluating parts produced by additive manufacturing (AM) in terms of geometrical and dimensional characteristics, internal defects, and surface topography. In particular, CT enables non‐destructive measurements of both internal and difficult‐to‐access geometries, features and surfaces (including micro-scale re-entrant surface features typical in metal AM parts), overcoming the main limitations of contact and optical measuring techniques. This presentation deals with the ongoing research at the University of Padova (Italy) aimed at developing advanced CT-based surface topography measurement procedures to improve the understanding and precision of AM processes.