Electron Thermalization in Para-H2 at Very Low Temperature

In this study, we investigate the thermalization length of quasifree electrons in a parahydrogen solid film (p-H2) at T ˜ 2.8K using charge collection measurements. Electrons are injected into the system via the photoelectric effect, and their transport behavior is analyzed. The measured thermalization length z0 = (26.1 ± 1.0) nm is consistent with previous studies in different systems indicating that electron transport remains largely unhindered by short-range localization effects, although it exhibits rapid energy dissipation through electron-phonon interactions. These findings provide insights into charge transport mechanisms in quantum solids.