CESCHIA, MARCO
 Distribuzione geografica
Continente #
NA - Nord America 217
EU - Europa 23
AS - Asia 12
Totale 252
Nazione #
US - Stati Uniti d'America 217
CN - Cina 10
IT - Italia 7
FI - Finlandia 5
UA - Ucraina 4
SE - Svezia 3
DE - Germania 2
GB - Regno Unito 1
IN - India 1
NL - Olanda 1
SG - Singapore 1
Totale 252
Città #
Ann Arbor 37
Fairfield 31
Chandler 21
Woodbridge 20
Jacksonville 18
Wilmington 15
Seattle 13
San Diego 11
Houston 10
Ashburn 8
Beijing 5
Cambridge 5
Princeton 5
Roxbury 4
Medford 3
Nanjing 3
Helsinki 2
Venice 2
Boardman 1
Cleveland 1
Jinan 1
London 1
Norwalk 1
San Francisco 1
Shenyang 1
Singapore 1
Totale 221
Nome #
Forward and reverse characteristics of irradiated MOSFETs 85
Low-Field Current on Thin Oxides After Constant Current or Irradiation Stresses 68
Noise Characteristics of Radiation-Induced Soft Breakdown Current in Ultrathin oxides 56
A MODEL OF RADIATION INDUCED LEAKAGE CURRENT (RILC) IN ULTRA-THIN OXIDES 44
Totale 253
Categoria #
all - tutte 803
article - articoli 647
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 1.450


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2018/201910 0 0 0 0 0 0 0 0 0 0 5 5
2019/202045 6 0 1 2 2 2 6 6 5 5 8 2
2020/202137 3 2 3 2 2 2 3 6 5 1 2 6
2021/202255 7 11 1 4 0 2 5 5 1 5 3 11
2022/202339 6 3 0 3 7 10 0 4 2 0 4 0
2023/20246 2 2 0 2 0 0 0 0 0 0 0 0
Totale 253