A field-assisted solid-state ion exchange technique is used for the first time to dope surface layers of silicate glasses with erbium at the concentration of the order of a few 10(20) Er cm(-3). Rutherford backscattering spectrometry, extended x-ray absorption fine structure spectroscopy and photoluminescence spectroscopy are used to characterize the samples treated after erbium oxide films were formed on soda-lime glass slides.
Doping of silicate glasses with erbium by a field-assisted solid-state ion exchange technique
CATTARUZZA, ELTI;BATTAGLIN, GIANCARLO;GONELLA, FRANCESCO;MAURIZIO, CHIARA;TRAVE, ENRICO
2009
Abstract
A field-assisted solid-state ion exchange technique is used for the first time to dope surface layers of silicate glasses with erbium at the concentration of the order of a few 10(20) Er cm(-3). Rutherford backscattering spectrometry, extended x-ray absorption fine structure spectroscopy and photoluminescence spectroscopy are used to characterize the samples treated after erbium oxide films were formed on soda-lime glass slides.
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