Many lead silicate historical glasses suffer degradation phenomena often observed as color changes and iridescence caused by lead ions leaching from the outer layers of the glass. In order to repair and to prevent these phenomena, glasses with large amounts of lead (6.7 and 14.3 at.% of lead) have been coated with silica films at neutral pH by dipping them in a precursor solution of TEOS (tetraethyl orthosilicate), ethyl alcohol and deionized water without any other acid or basic catalyst. Experiments with long dipping times (24 h) and temperatures around 20 °C have been performed to evaluate the role of lead ions of the glass as a catalyst. Silica films of very good quality and optical transparency have been also obtained on lead-free, soda-lime glasses by adding catalytic amounts of Pb(NO3)2 instead of HCl to the precursor solution. The films have been characterized by optical microscopy, AFM (Atomic Force Microscopy), XPS (X-ray Photoelectron Spectroscopy) and SIMS (Secondary Ion Mass Spectrometry).

Sol-gel deposition of silica films on silicate glasses: Influence of the presence of lead in the glass or in precursor solutions

BERTONCELLO, RENZO;SADA, CINZIA
2006

Abstract

Many lead silicate historical glasses suffer degradation phenomena often observed as color changes and iridescence caused by lead ions leaching from the outer layers of the glass. In order to repair and to prevent these phenomena, glasses with large amounts of lead (6.7 and 14.3 at.% of lead) have been coated with silica films at neutral pH by dipping them in a precursor solution of TEOS (tetraethyl orthosilicate), ethyl alcohol and deionized water without any other acid or basic catalyst. Experiments with long dipping times (24 h) and temperatures around 20 °C have been performed to evaluate the role of lead ions of the glass as a catalyst. Silica films of very good quality and optical transparency have been also obtained on lead-free, soda-lime glasses by adding catalytic amounts of Pb(NO3)2 instead of HCl to the precursor solution. The films have been characterized by optical microscopy, AFM (Atomic Force Microscopy), XPS (X-ray Photoelectron Spectroscopy) and SIMS (Secondary Ion Mass Spectrometry).
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11577/2447602
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