The surface morphology and the lattice constants of NiO overlayers in the thickness range of 1–20 monolayers (NiO nanolayers) on Pd(1 0 0) have been investigated by high-resolution spot profile low-energy electron diffraction (SPA-LEED) and scanning tunneling microscopy (STM). NiO islands grow epitaxially on Pd(1 0 0) on top of a c(4 × 2) Ni3O4 monolayer with a compressed strained lattice, which relaxes gradually attaining the bulk lattice constant at 10–12 monolayers. The strain relaxation is accompanied by the formation of small angle mosaic defect regions at the surface, which have been characterised quantitatively by following the behaviour of the satellites to the main Bragg diffraction rods. The analysis of the diffuse scattering intensity around the (0 0) diffraction spot reveals anisotropic NiO island shapes, whose orientation depends on the growth conditions. An incommensurate superlattice in LEED and STM at intermediate NiO coverages (∼2–6 monolayers) is observed and its origin is discussed.

Strain relaxation and surface morphology of nickel oxide nanolayers

GRANOZZI, GAETANO;AGNOLI, STEFANO;
2006

Abstract

The surface morphology and the lattice constants of NiO overlayers in the thickness range of 1–20 monolayers (NiO nanolayers) on Pd(1 0 0) have been investigated by high-resolution spot profile low-energy electron diffraction (SPA-LEED) and scanning tunneling microscopy (STM). NiO islands grow epitaxially on Pd(1 0 0) on top of a c(4 × 2) Ni3O4 monolayer with a compressed strained lattice, which relaxes gradually attaining the bulk lattice constant at 10–12 monolayers. The strain relaxation is accompanied by the formation of small angle mosaic defect regions at the surface, which have been characterised quantitatively by following the behaviour of the satellites to the main Bragg diffraction rods. The analysis of the diffuse scattering intensity around the (0 0) diffraction spot reveals anisotropic NiO island shapes, whose orientation depends on the growth conditions. An incommensurate superlattice in LEED and STM at intermediate NiO coverages (∼2–6 monolayers) is observed and its origin is discussed.
File in questo prodotto:
Non ci sono file associati a questo prodotto.
Pubblicazioni consigliate

Caricamento pubblicazioni consigliate

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11577/2448303
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 31
  • ???jsp.display-item.citation.isi??? 26
social impact