X-ray photoelectron diffraction (XPD) measurements have demonstrated that Ni ultrathin films on Pt(111) exhibit a single domain fcc stacking pseudomorphic to the substrate, with a consequent trigonal distortion of the Ni unit cell in order to accommodate the in-plane expansion of the Ni lattice parameter of about 11% with respect to its bulk value. We show that the amount of interlayer contraction and the strain energy resulting form the trigonal distortion are very well predicted by a strain analysis in the framework of simple linear elasticity theory. Strain analysis also allows to discuss in some detail the controversial case of Co growth on the same substrate. Finally, we discuss the dependence of the strain energy of the overlayer on the substrate crystal orientation and its effects on chemisorption experiments performed on heteroepitaxial monolayers (HML).

Strain analysis of epitaxial ultrathin films on Pt(111)

SAMBI, MAURO;GRANOZZI, GAETANO
1998

Abstract

X-ray photoelectron diffraction (XPD) measurements have demonstrated that Ni ultrathin films on Pt(111) exhibit a single domain fcc stacking pseudomorphic to the substrate, with a consequent trigonal distortion of the Ni unit cell in order to accommodate the in-plane expansion of the Ni lattice parameter of about 11% with respect to its bulk value. We show that the amount of interlayer contraction and the strain energy resulting form the trigonal distortion are very well predicted by a strain analysis in the framework of simple linear elasticity theory. Strain analysis also allows to discuss in some detail the controversial case of Co growth on the same substrate. Finally, we discuss the dependence of the strain energy of the overlayer on the substrate crystal orientation and its effects on chemisorption experiments performed on heteroepitaxial monolayers (HML).
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11577/2453489
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