Lanthanum cobaltite (LaCoO3) nanosystems were synthesised by an innovative combined use of the chemical vapor deposition (CVD) and sol-gel (SG) routes. In particular, a lanthanum oxyfluoride based layer was deposited by CVD on CoOx(OH)y SG substrates (xerogel). The subsequent thermal treatment in air, between 400 and 900 °C, was aimed at promoting the solid-state reaction between La-O and Co-O based layers, resulting in the complete formation of LaCoO3 . The obtained samples were analyzed by glancing incidence x-ray diffraction (GIXRD), transmission electron microscopy (TEM), atomic force microscopy (AFM), secondary ion mass spectrometry (SIMS), x-ray photoelectron (XPS) and x-ray excited Auger electron (XE-AES) spectroscopies, for a detailed determination of their microstructure, chemical composition, and surface morphology. The present work focuses on the XPS and XE-AES analysis of a selected lanthanum cobaltite (LaCoO3) thin film, annealed at 700 °C for 2 h. Besides the wide scan spectrum, detailed spectra for the La 3d, Co 2p, Co LMM, O 1s, and C 1s regions and related data are presented and discussed. Both the experimental Co 2p3/2-Co 2p1/2 energy splitting and the evaluation of the Auger parameter point out to the formation of single-phase lanthanum cobaltite thin film. The presence of fluorine was never detected, indicating its elimination after thermal treatment. Moreover, carbon contamination was merely limited to the outermost sample layers.

LaCoO3 nanosystems by a hybrid CVD/Sol-Gel Route: an XPS investigation

ARMELAO L.;GASPAROTTO, ALBERTO;MARAGNO, CINZIA;TONDELLO, EUGENIO
2003

Abstract

Lanthanum cobaltite (LaCoO3) nanosystems were synthesised by an innovative combined use of the chemical vapor deposition (CVD) and sol-gel (SG) routes. In particular, a lanthanum oxyfluoride based layer was deposited by CVD on CoOx(OH)y SG substrates (xerogel). The subsequent thermal treatment in air, between 400 and 900 °C, was aimed at promoting the solid-state reaction between La-O and Co-O based layers, resulting in the complete formation of LaCoO3 . The obtained samples were analyzed by glancing incidence x-ray diffraction (GIXRD), transmission electron microscopy (TEM), atomic force microscopy (AFM), secondary ion mass spectrometry (SIMS), x-ray photoelectron (XPS) and x-ray excited Auger electron (XE-AES) spectroscopies, for a detailed determination of their microstructure, chemical composition, and surface morphology. The present work focuses on the XPS and XE-AES analysis of a selected lanthanum cobaltite (LaCoO3) thin film, annealed at 700 °C for 2 h. Besides the wide scan spectrum, detailed spectra for the La 3d, Co 2p, Co LMM, O 1s, and C 1s regions and related data are presented and discussed. Both the experimental Co 2p3/2-Co 2p1/2 energy splitting and the evaluation of the Auger parameter point out to the formation of single-phase lanthanum cobaltite thin film. The presence of fluorine was never detected, indicating its elimination after thermal treatment. Moreover, carbon contamination was merely limited to the outermost sample layers.
2003
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11577/2460168
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