We have shown that after heavy ion irradiation the gate current is affected by a large multilevel RTN, whose time constants depends on temperature. Moreover, An original model of the noise is proposed

Noise Characteristics of Radiation Induced Soft Breakdown Current in Ultra-Thin Gate Oxides

CESTER, ANDREA;A. Paccagnella
2001

Abstract

We have shown that after heavy ion irradiation the gate current is affected by a large multilevel RTN, whose time constants depends on temperature. Moreover, An original model of the noise is proposed
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11577/2512289
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