CESTER, ANDREA

CESTER, ANDREA  

Dipartimento di Ingegneria dell'Informazione - DEI  

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Risultati 1 - 20 di 215 (tempo di esecuzione: 0.112 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Low-Field Current on Thin Oxides After Constant Current or Irradiation Stresses 1998 CESCHIA, MARCOPACCAGNELLA, ALESSANDROCESTER, ANDREA + - - -
Radiation induced leakage current and stress induced leakage current on ultra-thin gate oxides 1998 A. PaccagnellaCESTER, ANDREA + - - -
Radiation Induced Leakage Current and Stress Induced Leakage Current in Ultra-Thin Gate Oxides 1998 PACCAGNELLA, ALESSANDROCESTER, ANDREA + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
The Dependence of the Ionizing Radiation Induced Leakage Current versus the total dose on Ultra-Thin Gate Oxides 1998 A. PACCAGNELLACESTER, ANDREA + - - -
Stress Induced Leakage Current and Radiation Induced Leakage Current in MOS devices with ultra-thin gate oxide 1999 CESTER, ANDREAA. PACCAGNELLA + - - INFM Meeting
Time Decay of Stress Induced Leakage Current in Thin Gate Oxides by Low-Field Electron Injection 1999 CESTER, ANDREAA. PACCAGNELLA + - - -
Low-field current on thin oxides after constant current or radiation stresses 1999 PACCAGNELLA, ALESSANDROCESTER, ANDREA + JOURNAL OF NON-CRYSTALLINE SOLIDS - -
Time stability of Stress Induced Leakage Current in thin gate oxides 1999 CESTER, ANDREAPACCAGNELLA, ALESSANDRO + - - Proceedings of the 29th European Solid-State Device Research Conference
Stress Induced Leakage Current dependence on frequency after voltage pulsed stress 1999 CESTER, ANDREAA. PACCAGNELLA + - - -
Temperature dependence of Stress Induced Leakage Current in ultra-thin gate oxide 1999 PACCAGNELLA, ALESSANDROCESTER, ANDREA + - - -
Total dose dependence of radiation-induced leakage current in ultra-thin gate oxides 1999 PACCAGNELLA, ALESSANDROCESTER, ANDREA + MICROELECTRONICS RELIABILITY - -
From Radiation Induced Leakage Current to soft-breakdown in irradiated MOS devices with ultra-thin gate oxide 2000 A. PACCAGNELLACESTER, ANDREA + MATERIALS RESEARCH SOCIETY SYMPOSIA PROCEEDINGS - -
Soft Breakdown in Ultra-Thin gate oxide after constant current Stress 2000 CESTER, ANDREAA. PACCAGNELLA + - - -
TEMPERATURE DEPENDENCE OF CURRENT NOISE FLUCTUATION OF SOFT BREAKDOWN IN ULTRA-THIN OXIDES 2000 CESTER, ANDREAPACCAGNELLA, ALESSANDRO + - - -
Stress Induced Leakage Current under pulsed voltage stress 2000 CESTER, ANDREAA. PACCAGNELLA + - - -
Temperature dependence of Soft Breakdown Current Noise and fluctuations in thin oxides 2000 CESTER, ANDREAPACCAGNELLA, ALESSANDRO + - - -
Time decay of stress induced leakage current in thin gate oxides by low-field electron injection 2000 CESTER, ANDREAPACCAGNELLA, ALESSANDRO + MICROELECTRONICS RELIABILITY - -
Switching Behaviour and Noise of Soft Breakdown Current in Ultra-Thin Gate Oxide 2000 CESTER, ANDREAPACCAGNELLA, ALESSANDRO + - - Proceeding of the 30th European Solid-State Device Research Conference
Pulsed Voltage Stress on thin oxides 2000 CESTER, ANDREAPACCAGNELLA, ALESSANDRO + ELECTRONICS LETTERS - -
Post-radiation-induced soft breakdown conduction properties as a function of temperature 2001 CESTER, ANDREAPACCAGNELLA, ALESSANDRO + APPLIED PHYSICS LETTERS - -