The latch-up phenomenon in CMOS is studied by means of a new analytical technique, based on capacitively coupled voltage contrast and image subtraction
Titolo: | Observation of latch-up phenomena in CMOS IC's by means of Digital Differential Voltage Contrast |
Autori: | |
Data di pubblicazione: | 1984 |
Abstract: | The latch-up phenomenon in CMOS is studied by means of a new analytical technique, based on capacitively coupled voltage contrast and image subtraction |
Handle: | http://hdl.handle.net/11577/2514382 |
Appare nelle tipologie: | 04.01 - Contributo in atti di convegno |
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