Effects of high current density and temperature closely combine to degrade power MESFETs during their operating life in radio-link systems. To understand failure mechanisms and distinguish between those accelerated by high current and/or by temperature, we have performed various dc tests and measured thermal resistance and thermal maps of tested devices.
Effects of high current and temperature in power MESFET metallization
ZANONI, ENRICO
1987
Abstract
Effects of high current density and temperature closely combine to degrade power MESFETs during their operating life in radio-link systems. To understand failure mechanisms and distinguish between those accelerated by high current and/or by temperature, we have performed various dc tests and measured thermal resistance and thermal maps of tested devices.
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