This chapter summarizes results concerning failure modes and mechanisms observed during reliability evaluation tests on both power GaAs MESFETS and low-noise GaAs-based MESFETS and HEMTS, with particular emphasis on the results obtained on commercially available devices of different manufacturers

Reliability issues of discrete FETs and HEMTs

ZANONI, ENRICO;
1992

Abstract

This chapter summarizes results concerning failure modes and mechanisms observed during reliability evaluation tests on both power GaAs MESFETS and low-noise GaAs-based MESFETS and HEMTS, with particular emphasis on the results obtained on commercially available devices of different manufacturers
1992
Reliability of gallium arsenide MMICs
0471934909
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11577/2516257
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