This chapter summarizes results concerning failure modes and mechanisms observed during reliability evaluation tests on both power GaAs MESFETS and low-noise GaAs-based MESFETS and HEMTS, with particular emphasis on the results obtained on commercially available devices of different manufacturers
Reliability issues of discrete FETs and HEMTs
ZANONI, ENRICO;
1992
Abstract
This chapter summarizes results concerning failure modes and mechanisms observed during reliability evaluation tests on both power GaAs MESFETS and low-noise GaAs-based MESFETS and HEMTS, with particular emphasis on the results obtained on commercially available devices of different manufacturersFile in questo prodotto:
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