Results are presented showing the radiation response of ac-coupled FOXFET biased microstrip detectors and related test patterns to be used in the microvertex detector of the CDF experiment at Fermi National Laboratory. Radiation tolerance of detectors to gamma and proton irradiation has been tested and the radiation induced variations of the dc electrical parameters have been analyzed. Long term post-irradiation behaviour of detector characteristics have been studied, and the relevant room temperature annealing phenomena have been discussed.

Degradation of Silicon Ac-coupled Microstrip Detectors Induced By Radiation

BISELLO, DARIO;PACCAGNELLA, ALESSANDRO;
1993

Abstract

Results are presented showing the radiation response of ac-coupled FOXFET biased microstrip detectors and related test patterns to be used in the microvertex detector of the CDF experiment at Fermi National Laboratory. Radiation tolerance of detectors to gamma and proton irradiation has been tested and the radiation induced variations of the dc electrical parameters have been analyzed. Long term post-irradiation behaviour of detector characteristics have been studied, and the relevant room temperature annealing phenomena have been discussed.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11577/2518498
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