DALPASSO, MARCELLO
DALPASSO, MARCELLO
Dipartimento di Ingegneria dell'Informazione - DEI
A BIST Scheme for Non-Volatile Memories
1998 P., Olivo; Dalpasso, Marcello
A method for increasing the Iddq testability
1997 Dalpasso, Marcello; Favalli, M.
Advanced Test Pattern Generation for CMOS IDDQ Testing
1996 Dalpasso, Marcello
Algorithmic strategies for a fast exploration of the TSP 4-OPT neighborhood
2024 Lancia, Giuseppe; Dalpasso, Marcello
Analysis of resistive bridging fault detection in BiCMOS digital ICs
1993 Favalli, M.; Dalpasso, Marcello; Olivo, P.; Ricco', B.
Applications of Boolean Satisfiability to Verification and Testing of Switch-Level Circuits
2014 M., Favalli; Dalpasso, Marcello
Boolean and pseudo-boolean test generation for feedback bridging faults
2016 Favalli, Michele; Dalpasso, Marcello
Bridging Fault Modeling and Simulation for Deep Submicron CMOS ICs
2002 Favalli, M.; Dalpasso, Marcello
Efficient testing of multi-output combinational cells in nano-complementary metal oxide semiconductor integrated circuits
2014 Valenti, L.; Dalpasso, Marcello; Favalli, M.
Estimating the strength of poker hands by integer linear programming techniques
2015 Dalpasso, Marcello; Lancia, Giuseppe
FASTSET: A Fast Data Structure for the Representation of Sets of Integers
2019 Lancia, Giuseppe; Dalpasso, Marcello
Fault simulation of parametric bridging faults in CMOS IC's
1993 Dalpasso, Marcello; Favalli, M.; Olivo, P.; Ricco', B.
Finding the best 3-opt move in subcubic time
2020 Lancia, G.; Dalpasso, M.
How Many Test Vectors We Need to Detect a Bridging Fault?
2009 M., Favalli; Dalpasso, Marcello
Iddq test invalidation by break faults
1996 Dalpasso, Marcello; Favalli, M.; Olivo, P.
Modeling and simulation of broken connections in CMOS IC's
1996 Favalli, M.; Dalpasso, Marcello; Olivo, P.
Realistic testability estimates for CMOS ICs
1994 Dalpasso, Marcello; Favalli, M.; Olivo, P.; Teixeira, J. P.
Simulazione di guasti in circuiti integrati digitali
1992 M., Favalli; Dalpasso, Marcello
Symbolic Handling of Bridging Fault Effects
1997 M., Favalli; Dalpasso, Marcello
Techniques for SAT-Based Boolean Reasoning on Multiple Faults Affecting Logic Cells and Interconnects in Digital ICs
2022 Dall'Occo, F.; Dalpasso, M.; Favalli, M.