VACCARO, ALESSANDRO
VACCARO, ALESSANDRO
Dipartimento di Tecnica e Gestione dei Sistemi Industriali - DTG
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Influence of Power Cycling Test Methodology on the Applicability of the Linear Damage Accumulation Rule for the Lifetime Estimation in Power Devices
2023 Vaccaro, A.; Magnone, P.
Predicting Lifetime of Semiconductor Power Devices under Power Cycling Stress using Artificial Neural Network
2023 Vaccaro, A.; Magnone, P.; Zilio, A.; Mattavelli, P.
Remaining Useful Lifetime Prediction of Discrete Power Devices by Means of Artificial Neural Networks
2023 Vaccaro, A.; Biadene, D.; Magnone, P.