MAGNONE, PAOLO

MAGNONE, PAOLO  

Dipartimento di Tecnica e Gestione dei Sistemi Industriali - DTG  

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Risultati 1 - 20 di 103 (tempo di esecuzione: 0.036 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Impact of the interfacial layer on the low-frequency noise (1/f) behavior of MOSFETs with advanced gate stacks 2006 Magnone P + IEEE ELECTRON DEVICE LETTERS - -
Impact of the interfacial layer on the low-frequency noise (1/f) behavior of MOSFETs with advanced gate stacks 2006 MAGNONE P + - - Workshop on Dielectrics in Microelectronics
Interfacial layer quality effects on low-frequency noise (1/f) in p-MOSFETs with advanced gate stacks 2007 Magnone P + MICROELECTRONICS RELIABILITY - -
Low frequency noise in nMOSFETs with subnanometer EOT hafnium-based gate dielectrics 2007 Magnone P + MICROELECTRONICS RELIABILITY - -
Fermi-level pinning at polycrystalline silicon-HfO2 interface as a source of drain and gate current 1/f noise 2007 Magnone P + APPLIED PHYSICS LETTERS - -
Performance of current mirror with high-k gate dielectrics 2008 Magnone P + MICROELECTRONIC ENGINEERING - -
A model for MOS gate stack quality evaluation based on the gate current 1/f noise 2008 MAGNONE P + - - International Conference on Ultimate Integration on Silicon
Modeling the gate current 1/f noise and its application to advanced CMOS devices 2008 MAGNONE P + - - International Conference on Solid-State and Integrated-Circuit Technology
On the impact of defects close to the gate electrode on the low-frequency 1/f noise 2008 Magnone P + IEEE ELECTRON DEVICE LETTERS - -
Gate voltage and geometry dependence of the series resistance and of the carrier mobility in FinFET devices 2008 Magnone P + MICROELECTRONIC ENGINEERING - -
The role of the interfaces in the 1/f noise of MOSFETs with high-k gate stacks 2009 MAGNONE P + - - Meeting of the Electrochemical Society
Full Model and Characterization of Noise in Operational Amplifier 2009 Magnone P + IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS. I, REGULAR PAPERS - -
Understanding and Optimization of Hot-Carrier Reliability in Germanium-on-Silicon pMOSFETs 2009 Magnone P + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Matching Performance of FinFET Devices With Fin Widths Down to 10 nm 2009 Magnone P + IEEE ELECTRON DEVICE LETTERS - -
Analytical model for the 1/f noise in the tunneling current through metal-oxide-semiconductor structures 2009 Magnone P + JOURNAL OF APPLIED PHYSICS - -
Characterization of interface and oxide traps in Ge pMOSFETs based on DCIV technique 2009 Magnone P + - - International Workshop on Electron Devices and Semiconductor Technology
1/f Noise in Drain and Gate Current of MOSFETs With High-k Gate Stacks 2009 Magnone P + IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY - -
FinFET Mismatch in Subthreshold Region: Theory and Experiments 2010 Magnone P + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Experimental study of leakage-delay trade-off in Germanium pMOSFETs for logic circuits 2010 Magnone P + - - Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
High-mobility 0.85nm-EOT Si0.45Ge0.55-pFETs: Delivering high performance at scaled VDD 2010 Magnone P + - - International Electron Device Meeting 2010