The effect of air/AlGaN and GaN/substrate polarization charges on the dc performances of GaN-based HEMTs have been investigated. We find that the calculated dc drain current is 2 times higher than the experimental measurements. Our work show that the polarizations charges appears as the source of dc drain current premature saturation observed in GaNbased HEMTs.

Current collapse associated with surface states in GaN-based HEMT's. Theoretical/experimental investigations

MENEGHESSO, GAUDENZIO;ZANONI, ENRICO
2004

Abstract

The effect of air/AlGaN and GaN/substrate polarization charges on the dc performances of GaN-based HEMTs have been investigated. We find that the calculated dc drain current is 2 times higher than the experimental measurements. Our work show that the polarizations charges appears as the source of dc drain current premature saturation observed in GaNbased HEMTs.
2004
SISPAD 2004, International Conference on Simulation of Semiconductor Processes and Devices
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11577/1353943
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