X-ray and Proton irradiation impact differently on Nanocrystals Memories producing charge loss and permanent degradations of the electrical characteristics. These effects are less pronounced than those ones observed on conventional floating gate based flash memories
Investigation of Proton and X-Ray Irradiation Effects on Nanocrystal and Floating Gate Memory Cell Arrays
WRACHIEN, NICOLA;CESTER, ANDREA;
2008
Abstract
X-ray and Proton irradiation impact differently on Nanocrystals Memories producing charge loss and permanent degradations of the electrical characteristics. These effects are less pronounced than those ones observed on conventional floating gate based flash memoriesFile in questo prodotto:
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