WRACHIEN, NICOLA

WRACHIEN, NICOLA  

Dipartimento di Ingegneria dell'Informazione - DEI  

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Risultati 1 - 20 di 75 (tempo di esecuzione: 0.028 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Ionising Radiation and Electrical Stress on Nanocrystal Memory Cell Array 2006 CESTER, ANDREAWRACHIEN, NICOLAA. PACCAGNELLA + - - -
Radiation Induced Modifications of the Electrical Characteristics of Nanocrystal Memory Cells and Arrays 2006 CESTER, ANDREAWRACHIEN, NICOLAA. Paccagnella + - - -
Total Ionizing Dose Effects on 4Mbit Phase Change Memory Arrays 2007 GASPERIN, ALBERTOWRACHIEN, NICOLACESTER, ANDREAPACCAGNELLA, ALESSANDRO + - ESA SP Radiation and Its Effects on Components and Systems, 2007.
Ionising radiation and electrical stress on nanocrystal memory cell array 2007 CESTER, ANDREAGASPERIN, ALBERTOWRACHIEN, NICOLAPACCAGNELLA, ALESSANDRO + MICROELECTRONICS RELIABILITY - -
Role of Oxide/Nitride Interface Traps on the Nanocrystal Memory Characteristics 2007 GASPERIN, ALBERTOCESTER, ANDREAWRACHIEN, NICOLAPACCAGNELLA, ALESSANDRO + - - Proceedings of IEEE - International Reliability Physics Symposium - IRPS 2007
Radiation Tolerance of Nanocrystal-Based Flash Memory Arrays Against Heavy Ion Irradiation 2007 CESTER, ANDREAWRACHIEN, NICOLAA. Paccagnella + - - -
Ionizing Radiation Effects on Ferroelectric Non Volatile Memories and its Dependence on the Irradiation Temperature 2008 CESTER, ANDREAWRACHIEN, NICOLA + - - -
Modeling of Heavy Ion Induced Charge Loss Mechanisms in Nanocrystal Memory Cell 2008 CESTER, ANDREAWRACHIEN, NICOLA + - - -
Investigation of Proton and X-Ray Irradiation Effects on Nanocrystal and Floating Gate Memory Cell Arrays 2008 WRACHIEN, NICOLACESTER, ANDREA + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Readout drain current dependence of programming window in nanocrystal memory cells 2008 WRACHIEN, NICOLAAUTIZI, ENRICOCESTER, ANDREA + ELECTRONICS LETTERS - -
Modeling of Heavy Ion Induced Charge Loss Mechanisms in Nanocrystal Memory Cell 2008 CESTER, ANDREAWRACHIEN, NICOLA + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Investigation of Proton and X-Ray Irradiation Effects on Nanocrystal and Floating Gate Memory Cell Arrays 2008 WRACHIEN, NICOLACESTER, ANDREA + - - -
Indium Zinc Oxide as an alternative to Indium Tin Oxide in OLEDs Technology 2008 PINATO, ALESSANDROMENEGHINI, MATTEOTAZZOLI, AUGUSTOCESTER, ANDREAWRACHIEN, NICOLAZANONI, ENRICOMENEGHESSO, GAUDENZIO + - - -
Charge Trapping in Organic Thin Film Transistors 2008 WRACHIEN, NICOLACESTER, ANDREAPINATO, ALESSANDROMENEGHINI, MATTEOTAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIO + - - -
Ionizing Radiation Effects on Ferroelectric Non Volatile Memories and its Dependence on the Irradiation Temperature 2008 WRACHIEN, NICOLACESTER, ANDREA + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Improved Reliability of Organic Light-Emitting Diodes with Indium-Zinc-Oxide Anode Contact 2009 PINATO, ALESSANDROMENEGHINI, MATTEOCESTER, ANDREAWRACHIEN, NICOLATAZZOLI, AUGUSTOZANONI, ENRICOMENEGHESSO, GAUDENZIO + - - -
Organic TFT with SiO2-Parylene Gate Dielectric Stack and Optimized Pentacene Growth Temperature 2009 WRACHIEN, NICOLACESTER, ANDREAPINATO, ALESSANDROMENEGHINI, MATTEOTAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIO + - - -
Threshold Voltage Instability in Organic TFT with SiO2 and SiO2/Parylene-Stack Dielectrics 2009 WRACHIEN, NICOLACESTER, ANDREAPINATO, ALESSANDROMENEGHINI, MATTEOTAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIO + - - -
Growth morphologies and electrical properties of pentacene organic TFT with SiO2/parylene dielectric layer 2009 WRACHIEN, NICOLACESTER, ANDREAMENEGHESSO, GAUDENZIO + - - -
Impact of Trapped Charge and Interface Defects on the Degradation of the Optical and Electrical Characteristics in NPD/Alq3 OLEDs 2010 PINATO, ALESSANDROCESTER, ANDREAMENEGHINI, MATTEOWRACHIEN, NICOLATAZZOLI, AUGUSTOZANONI, ENRICOMENEGHESSO, GAUDENZIO + IEEE TRANSACTIONS ON ELECTRON DEVICES - -