We investigated Ferroelectric Random Access Memory subjected to X-ray and proton irradiation. We addressed the radiation damage dependence on irradiation temperature, its stability during annealing and cycling, and the effects of supplied voltage and packaging

Ionizing Radiation Effects on Ferroelectric Non Volatile Memories and its Dependence on the Irradiation Temperature

CESTER, ANDREA;WRACHIEN, NICOLA
2008

Abstract

We investigated Ferroelectric Random Access Memory subjected to X-ray and proton irradiation. We addressed the radiation damage dependence on irradiation temperature, its stability during annealing and cycling, and the effects of supplied voltage and packaging
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11577/2512556
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