Custom CMOS ICs are very attractive for automotive applications; in the tough automotive environment, however, reliability hazards due to the 'latch-up' problem are greatly increased and a superior ability to avoid latch-up is therefore required. The purpose of this work is to discuss electrical measurements performed on custom CMOS ICs for automotive applications to verify their ability to avoid latch-up and to identify potentially dangerous technologies. Failure analysis of the structures which presented a high susceptibility to the phenomenon was performed by means of infrared microscopy and digital voltage contrast, which enabled latch-up sites to be located. Layout weaknesses were easily identified and eventual modifications were suggested to designers.

Latch-up Analysis of Cmos Integrated-circuits For Automotive Applications

ZANONI, ENRICO
1985

Abstract

Custom CMOS ICs are very attractive for automotive applications; in the tough automotive environment, however, reliability hazards due to the 'latch-up' problem are greatly increased and a superior ability to avoid latch-up is therefore required. The purpose of this work is to discuss electrical measurements performed on custom CMOS ICs for automotive applications to verify their ability to avoid latch-up and to identify potentially dangerous technologies. Failure analysis of the structures which presented a high susceptibility to the phenomenon was performed by means of infrared microscopy and digital voltage contrast, which enabled latch-up sites to be located. Layout weaknesses were easily identified and eventual modifications were suggested to designers.
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11577/2514049
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