This paper reviews issues related with Electro Static Discharge (ESD) effects on electron devices and integrated circuits. The common standards for the evaluation of the ESD robustness of ICs are described, as well as the strategies for designing protection circuits. Some examples of ESD failure analysis are also presented.
Le scariche elettrostatiche e i componenti elettronici: strutture di protezione e danneggiamenti indotti
ZANONI, ENRICO;
1989
Abstract
This paper reviews issues related with Electro Static Discharge (ESD) effects on electron devices and integrated circuits. The common standards for the evaluation of the ESD robustness of ICs are described, as well as the strategies for designing protection circuits. Some examples of ESD failure analysis are also presented.File in questo prodotto:
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