The dependence of the latch-up susceptibility on layout parameters is studied on four stripe structures made using different CMOS processes: a standard n-well, a twin-tub and twin-tub epitaxial technology. The correlation between triggering currents, well and substrate resistances and parasitic transistor gains is studied by means of emitter current triggering measurements and two-dimensional simulations using HFIELDS. Triggering currents higher than 250 mA are obtained on epitaxial structures with n+ guard-rings. Anomalies in triggering and holding electrical characteristics are caused by the three-dimensional distribution of the latch-up current, which is observed by IR microscopy. These anomalies can affect results of conventional latch-up testing methods

Latch-up DC triggering and holding characteristics of n-well, twin-tub and epitaxial CMOS technologies

SPIAZZI, GIORGIO;ZANONI, ENRICO;
1991

Abstract

The dependence of the latch-up susceptibility on layout parameters is studied on four stripe structures made using different CMOS processes: a standard n-well, a twin-tub and twin-tub epitaxial technology. The correlation between triggering currents, well and substrate resistances and parasitic transistor gains is studied by means of emitter current triggering measurements and two-dimensional simulations using HFIELDS. Triggering currents higher than 250 mA are obtained on epitaxial structures with n+ guard-rings. Anomalies in triggering and holding electrical characteristics are caused by the three-dimensional distribution of the latch-up current, which is observed by IR microscopy. These anomalies can affect results of conventional latch-up testing methods
File in questo prodotto:
Non ci sono file associati a questo prodotto.
Pubblicazioni consigliate

Caricamento pubblicazioni consigliate

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11577/2517070
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus ND
  • ???jsp.display-item.citation.isi??? ND
social impact