This paper describes a SRAM designed for space and nuclear physics applications. The device has been designed in a commercial 180 nm CMOS technology using RHBD techniques. Measurement on prototype samples under radiation demonstrate immunity to total dose and latch-up, and an adequate level of hardness with respect to single event effects.

A Multi-Megarad, Radiation Hardened by Design 512 kbit SRAM in CMOS Technology

BAGATIN, MARTA;GERARDIN, SIMONE;PACCAGNELLA, ALESSANDRO
2010

Abstract

This paper describes a SRAM designed for space and nuclear physics applications. The device has been designed in a commercial 180 nm CMOS technology using RHBD techniques. Measurement on prototype samples under radiation demonstrate immunity to total dose and latch-up, and an adequate level of hardness with respect to single event effects.
2010
2010 INTERNATIONAL CONFERENCE ON MICROELECTRONICS
9781612841519
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11577/2964921
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